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Co-authors
Feng YINThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Xiaozhe GuZWUVerified email at ntu.edu.sg
Artur DavoyanUniversity of California, Los AngelesVerified email at seas.ucla.edu
Haonan LingAssistant professor in MAE @UCF; Ph.D. in ME @UCLAVerified email at ucf.edu
Wenye LiThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Yin Zhang (张寅)The Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Taojie ZhouAssociate Professor, School of Microelectronics, South China University of TechnologyVerified email at scut.edu.cn
Mingchu TangUniversity College LondonVerified email at ucl.ac.uk
Thierry BaronCNRS, Université Grenoble AlpesVerified email at cea.fr
Sergios TheodoridisNational and Kapodistrian University of Athens, Greece and Aalborg University DenmarkVerified email at di.uoa.gr
Zhaoyu ZhangAssociate Professor, The Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Zhen LiAssistant Professor, the Chinese University of Hong Kong, Shenzhen (CUHKSZ)Verified email at cuhk.edu.cn