| Effectiveness of SEL hardening strategies and the latchup domino effect NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ... IEEE Transactions on Nuclear Science 59 (6), 2642-2650, 2012 | 68 | 2012 |
| Comparison of single event transients generated at four pulsed-laser test facilities-NRL, IMS, EADS, JPL S Buchner, N Roche, J Warner, D McMorrow, F Miller, S Morand, ... IEEE Transactions on Nuclear Science 59 (4), 988-998, 2012 | 60 | 2012 |
| Single-event effect performance of a commercial embedded ReRAM D Chen, H Kim, A Phan, E Wilcox, K LaBel, S Buchner, A Khachatrian, ... IEEE Transactions on Nuclear Science 61 (6), 3088-3094, 2014 | 52 | 2014 |
| A dosimetry methodology for two-photon absorption induced single-event effects measurements A Khachatrian, NJH Roche, D McMorrow, JH Warner, SP Buchner, ... IEEE Transactions on Nuclear Science 61 (6), 3416-3423, 2014 | 43 | 2014 |
| Design of radiation-hardened RF low-noise amplifiers using inverse-mode SiGe HBTs I Song, S Jung, NE Lourenco, US Raghunathan, ZE Fleetwood, ... IEEE transactions on Nuclear Science 61 (6), 3218-3225, 2014 | 42 | 2014 |
| Experimental validation of an equivalent LET approach for correlating heavy-ion and laser-induced charge deposition JM Hales, A Khachatrian, S Buchner, NJH Roche, J Warner, ... IEEE Transactions on Nuclear Science 65 (8), 1724-1733, 2018 | 41 | 2018 |
| SEL-sensitive area mapping and the effects of reflection and diffraction from metal lines on laser SEE testing NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ... IEEE Transactions on Nuclear Science 60 (4), 2550-2558, 2013 | 41 | 2013 |
| The use of a dose-rate switching technique to characterize bipolar devices JÉÔ Boch, YG Velo, FÉÉ Saigne, NJH Roche, RD Schrimpf, JR Vaille, ... IEEE transactions on Nuclear Science 56 (6), 3347-3353, 2009 | 41 | 2009 |
| The effects of low dose-rate ionizing radiation on the shapes of transients in the L> M124 operational amplifier S Buchner, D McMorrow, N Roche, L Dusseau, RL Pease IEEE Transactions on Nuclear Science 55 (6), 3314-3320, 2008 | 38 | 2008 |
| Using TCAD modeling to compare heavy-ion and laser-induced single event transients in SiGe HBTs ZE Fleetwood, NE Lourenco, A Ildefonso, JH Warner, MT Wachter, ... IEEE Transactions on Nuclear Science 64 (1), 398-405, 2016 | 35 | 2016 |
| A simplified approach for predicting pulsed-laser-induced carrier generation in semiconductor JM Hales, A Khachatrian, S Buchner, NJH Roche, J Warner, D McMorrow IEEE Transactions on Nuclear Science 64 (3), 1006-1013, 2017 | 34 | 2017 |
| Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment NJH Roche, L Dusseau, JR Vaillé, J Mekki, YG Velo, S Perez, J Boch, ... IEEE Transactions on Nuclear Science 57 (6), 3392-3399, 2010 | 31 | 2010 |
| Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits L Dusseau, M Bernard, J Boch, YG Velo, N Roche, E Lorfevre, F Bezerra, ... IEEE Transactions on Nuclear Science 55 (6), 3174-3181, 2008 | 31 | 2008 |
| A Comparison of Single-Event Transients in Pristine and Irradiated HEMTs using Two-Photon Absorption and Heavy Ions A Khachatrian, NJH Roche, S Buchner, AD Koehler, TJ Anderson, ... IEEE Transactions on Nuclear Science 62 (6), 2743-2751, 2015 | 30 | 2015 |
| Modeling and investigations on TID-ASETs synergistic effect in LM124 operational amplifier from three different manufacturers F Roig, L Dusseau, A Khachatrian, NJH Roche, A Privat, JR Vaillé, J Boch, ... IEEE Transactions on Nuclear Science 60 (6), 4430-4438, 2013 | 30 | 2013 |
| The impact of technology scaling on the single-event transient response of SiGe HBTs NE Lourenco, ZE Fleetwood, A Ildefonso, MT Wachter, NJH Roche, ... IEEE Transactions on Nuclear Science 64 (1), 406-414, 2016 | 29 | 2016 |
| Simulation of laser-based two-photon absorption induced charge carrier generation in silicon JM Hales, A Khachatrian, NJH Roche, JH Warner, SP Buchner, ... IEEE Transactions on Nuclear Science 62 (4), 1550-1557, 2015 | 29 | 2015 |
| Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology AS Cardoso, PS Chakraborty, N Karaulac, DM Fleischhauer, ... IEEE transactions on Nuclear Science 61 (6), 3210-3217, 2014 | 27 | 2014 |
| Total ionizing dose effects in piezoelectric MEMS relays RM Proie, RG Polcawich, CD Cress, LM Sanchez, AD Grobicki, ... IEEE Transactions on Nuclear Science 60 (6), 4505-4511, 2013 | 27 | 2013 |
| Spatial mapping of pristine and irradiated AlGaN/GaN HEMTs with UV single-photon absorption single-event transient technique A Khachatrian, NJH Roche, SP Buchner, AD Koehler, JD Greenlee, ... IEEE Transactions on Nuclear Science 63 (4), 1995-2001, 2016 | 26 | 2016 |
Dale P. McMorrowNaval Research LaboratoryVerified email at nrl.navy.mil
