| Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip DA Santos, AMP Mattos, DR Melo, L Dilillo Electronics 12 (12), 2557, 2023 | 10 | 2023 |
| Qualification and validation test methodology of the open-source CubeSat FloripaSat-I MG Mariano, FE Morsch, MS Vega, DMA Martins Pio, SL Oriel, SL Kessler, ... Journal of Systems Engineering and Electronics 31 (6), 1230-1244, 2020 | 10 | 2020 |
| Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments DA Santos, AMP Mattos, DR Melo, L Dilillo 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | 8 | 2023 |
| Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip DA Santos, AMP Mattos, LM Luza, C Cazzaniga, M Kastriotou, DR Melo, ... 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022 | 8 | 2022 |
| Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study LM Luza, D Söderström, AMP De Mattos, EA Bezerra, C Cazzaniga, ... 2021 16th International Conference on Design & Technology of Integrated …, 2021 | 6 | 2021 |
| Pre-flight qualification test procedure for nanosatellites using sounding rockets LK Slongo, JG Reis, D Gaiki, PVH Seger, SV Martínez, BVB Eiterer, ... Acta Astronautica 159, 564-577, 2019 | 6 | 2019 |
| Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip DA Santos, PM Aviles, AMP Mattos, M García-Valderas, L Entrena, ... IEEE Transactions on Nuclear Science, 2024 | 2 | 2024 |
| Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring AMP Mattos, DA Santos, LM Luza, V Gupta, L Dilillo Electronics 13 (10), 1822, 2024 | 2 | 2024 |
| Payload-XL: A platform for the in-orbit validation of the BRAVE FPGA F Viel, KR Gouveia, E Costa, M Oliveira, M Boing, AMP de Mattos, ... IEEE Embedded Systems Letters 15 (2), 93-96, 2022 | 2 | 2022 |
| Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V AMP Mattos, DA Santos, LM Luza, V Gupta, T Borel, L Dilillo IEEE Transactions on Nuclear Science, 2024 | 1 | 2024 |
| Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs D Söderström, LM Luza, AMP De Mattos, T Gil, H Kettunen, K Niskanen, ... IEEE Transactions on Nuclear Science, 2023 | 1 | 2023 |
| Floripasat-2: An open-source platform for cubesats GM Marcelino, AMP de Mattos, JCE Barcellos, BF Ribeiro, LO Seman, ... IEEE Embedded Systems Letters 16 (1), 77-80, 2023 | 1 | 2023 |
| Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons AMP Mattos, DA Santos, L Dilillo IEEE Access, 2024 | | 2024 |
| Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator C Imianosky, AMP Mattos, DA Santos, DR Melo, M Kastriotou, ... Electronics 13 (22), 4461, 2024 | | 2024 |
| Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments AMP Mattos, DA Santos, C Imianosky, DR Melo, L Dilillo 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI …, 2023 | | 2023 |
| Effects of High-Energy Protons on a Self-Refresh DRAM LM Luza, C Imianosky, AMP de Mattos, DA dos Santos, D Söderström, ... SELSE 2022-18th IEEE Workshop on Silicon Errors in Logic–System Effects, 2022 | | 2022 |
| Development of a satellite radiation experiment for evaluating SDRAM memories in harsh environments AMP Mattos Federal University of Santa Catarina, 2021 | | 2021 |
Luigi DililloIES, CNRS, University of MontpellierVerified email at umontpellier.fr