| Impact of pore anisotropy on the thermal conductivity of porous Si nanowires P Ferrando-Villalba, L D’Ortenzi, GG Dalkiranis, E Cara, AF Lopeandia, ... Scientific reports 8 (1), 12796, 2018 | 32 | 2018 |
| Supported porous nanostructures developed by plasma processing of metal phthalocyanines and porphyrins JM Obrero, AN Filippin, M Alcaire, JR Sanchez-Valencia, M Jacob, ... Frontiers in Chemistry 8, 520, 2020 | 12 | 2020 |
| Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis L Henry, N Bernier, M Jacob, G Navarro, L Clément, JL Rouvière, E Robin Acta Materialia 201, 72-78, 2020 | 11 | 2020 |
| Correlative STEM-HAADF and STEM-EDX tomography for the 3D morphological and chemical analysis of semiconductor devices M Jacob, J Sorel, RB Pinhiero, F Mazen, A Grenier, T Epicier, Z Saghi Semiconductor Science and Technology 36 (3), 035006, 2021 | 10 | 2021 |
| Gradient-based and wavelet-based compressed sensing approaches for highly undersampled tomographic datasets M Jacob, L El Gueddari, G Navarro, A Jannaud, G Mula, ... Ultramicroscopy 225, 113289, 2021 | 5 | 2021 |
| Supported porous nanostructures developed by plasma processing of metal phthalocyanines and porphyrins. Front Chem 8: 520 JM Obrero, AN Filippin, M Alcaire, JR Sanchez-Valencia, M Jacob, ... | 5 | 2020 |
| Statistical Machine Learning and Compressed Sensing Approaches for Analytical Electron Tomography-Application to Phase Change Materials M Jacob, L El Gueddari, G Navarro, MC Cyrille, P Bayle-Guillemaud, ... Microscopy and Microanalysis 25 (S2), 156-157, 2019 | 4 | 2019 |
| Multivariate analysis and compressed sensing methods for spectroscopic electron tomography of semiconductor devices M Jacob, T Sanders, N Bernier, A Grenier, RB Pinheiro, F Mazen, ... Microscopy and Microanalysis 24 (S1), 500-501, 2018 | 4 | 2018 |
| Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices J Sorel, M Jacob, T Sanders, A Grenier, RB Pinheiro, F Mazen, T Epicier, ... Microscopy and Microanalysis 24 (S1), 388-389, 2018 | 2 | 2018 |
| Recent advances in electron tomography and applications in the semiconductor Industry Z Saghi, G Biagi, M Jacob, P Ciuciu FCMN 2022-International Conference on Frontiers of Characterization and …, 2022 | | 2022 |
| Compressed sensing approaches applied to analytical electron tomography M Jacob < bound method Organization. get_name_with_acronym of< Organization: TEL …, 2021 | | 2021 |
| Approches parcimonieuses appliquées à la tomographie électronique analytique M Jacob Université Grenoble Alpes [2020-....], 2021 | | 2021 |
| Supported Porous Nanostructures Developed by Plasma Processing of Metal Phthalocyanines and Porphyrins JM Obrero Pérez, AN Filippin, M Alcaire Martín, JR Sánchez Valencia, ... Frontiers in Chemistry, 8, 520., 2020 | | 2020 |
