| Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs‐based diode lasers JW Tomm, M Ziegler, M Hempel, T Elsaesser Laser & Photonics Reviews 5 (3), 422-441, 2011 | 136 | 2011 |
| Defect evolution during catastrophic optical damage of diode lasers M Hempel, F La Mattina, JW Tomm, U Zeimer, R Broennimann, ... Semiconductor Science and Technology 26 (7), 075020, 2011 | 55 | 2011 |
| Catastrophic optical damage at front and rear facets of diode lasers M Hempel, JW Tomm, M Ziegler, T Elsaesser, N Michel, M Krakowski Applied Physics Letters 97 (23), 231101, 2010 | 49 | 2010 |
| Physical limits of semiconductor laser operation: A time-resolved analysis of catastrophic optical damage M Ziegler, M Hempel, HE Larsen, JW Tomm, PE Andersen, S Clausen, ... Applied Physics Letters 97 (2), 021110, 2010 | 44 | 2010 |
| Fast continuous tuning of terahertz quantum-cascade lasers by rear-facet illumination M Hempel, B Röben, L Schrottke, HW Hübers, HT Grahn Applied Physics Letters 108 (19), 191106, 2016 | 41 | 2016 |
| Microscopic origins of catastrophic optical damage in diode lasers M Hempel, JW Tomm, F La Mattina, I Ratschinski, M Schade, I Shorubalko, ... IEEE Journal of Selected Topics in Quantum Electronics 19 (4), 1500508-1500508, 2012 | 36 | 2012 |
| Assessing the influence of the vertical epitaxial layer design on the lateral beam quality of high-power broad area diode lasers M Winterfeldt, J Rieprich, S Knigge, A Maaßdorf, M Hempel, R Kernke, ... High-Power Diode Laser Technology and Applications XIV 9733, 97330O, 2016 | 31 | 2016 |
| How does external feedback cause AlGaAs-based diode lasers to degrade? M Hempel, M Chi, PM Petersen, U Zeimer, JW Tomm Applied Physics Letters 102 (2), 023502, 2013 | 31 | 2013 |
| Time‐resolved reconstruction of defect creation sequences in diode lasers M Hempel, JW Tomm, V Hortelano, N Michel, J Jim, M Krakowski, ... Laser & Photonics Reviews 6 (6), L15-L19, 2012 | 28 | 2012 |
| High-power diode lasers under external optical feedback B Leonhäuser, H Kissel, JW Tomm, M Hempel, A Unger, J Biesenbach High-Power Diode Laser Technology and Applications XIII 9348, 93480M, 2015 | 26 | 2015 |
| Kinetics of catastrophic optical damage in GaN-based diode lasers M Hempel, JW Tomm, B Stojetz, H König, U Strauss, T Elsaesser Semiconductor Science and Technology 30 (7), 072001, 2015 | 24 | 2015 |
| Near-field dynamics of broad area diode laser at very high pump levels M Hempel, JW Tomm, M Baeumler, H Konstanzer, J Mukherjee, ... AIP Advances 1 (4), 042148, 2011 | 23 | 2011 |
| Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers M Hempel, M Ziegler, JW Tomm, T Elsaesser, N Michel, M Krakowski Applied Physics Letters 96 (25), 251105, 2010 | 22 | 2010 |
| Terahertz quantum-cascade lasers as high-power and wideband, gapless sources for spectroscopy B Röben, X Lü, M Hempel, K Biermann, L Schrottke, HT Grahn Optics express 25 (14), 16282-16290, 2017 | 20 | 2017 |
| High single-spatial-mode pulsed power from 980 nm emitting diode lasers M Hempel, JW Tomm, T Elsaesser, M Bettiati Applied Physics Letters 101 (19), 191105, 2012 | 16 | 2012 |
| Continuous tuning of two-section, single-mode terahertz quantum-cascade lasers by fiber-coupled, near-infrared illumination M Hempel, B Röben, M Niehle, L Schrottke, A Trampert, HT Grahn AIP Advances 7 (5), 055201, 2017 | 14 | 2017 |
| Short‐wavelength infrared defect emission as a probe of degradation processes in 980 nm single‐mode diode lasers M Hempel, JW Tomm, F Yue, MA Bettiati, T Elsaesser Laser & Photonics Reviews 8 (5), L59-L64, 2014 | 14 | 2014 |
| Spectroscopic analysis of packaging concepts for high-power diode laser bars M Hempel, M Ziegler, S Schwirzke-Schaaf, JW Tomm, D Jankowski, ... Applied Physics A 107 (2), 371-377, 2012 | 14 | 2012 |
| Analysis of GaN based high‐power diode lasers after singular degradation events G Mura, M Vanzi, M Hempel, JW Tomm physica status solidi (RRL)–Rapid Research Letters 11 (7), 1700132, 2017 | 12 | 2017 |
| Long-Term Aging and Quick Stress Testing of 980-nm Single-Spatial Mode Lasers M Hempel, JW Tomm, D Venables, V Rossin, E Zucker, T Elsaesser Journal of Lightwave Technology 33 (21), 4450-4456, 2015 | 10 | 2015 |
