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Tianwai BoBeijing Institute of Technology; KAIST; CUHKVerified email at bit.edu.cn
Vuong MaiUniversity of Bradford, KAISTVerified email at bradford.ac.uk
Sunghyun BaeKangwon National UniversityVerified email at kangwon.ac.kr
Peter WinzerVerified email at ieee.org
PAUL K. J. PARKSamsung ElectronicsVerified email at samsung.com
Pooi Yuen KAMNational University of SingaporeVerified email at nus.edu.sg
Changyuan YuProfessor of EEE, Hong Kong Polytechnic University; National University of Singapore; Optica FellowVerified email at polyu.edu.hk
Ho-Chul JiSamsung ElectronicsVerified email at samsung.com
Jingjing ZhouNational University of SingaporeVerified email at u.nus.edu
Masatoshi SuzukiChitose Institute of Science and TechnologyVerified email at photon.chitose.ac.jp
Jichai JeongKorea UniversityVerified email at korea.ac.kr
Zonglong HeChalmers University of TechnologyVerified email at chalmers.se
Jun Haeng LeeSamsung Advanced Institute of TechnologyVerified email at samsung.com
Chul Han KimUniversity of SeoulVerified email at uos.ac.kr
R. M. JopsonBell LaboratoriesVerified email at nokia.com
Shota IshimuraKDDI Research, Inc.Verified email at kddi-research.jp
Qikai HuDepartment of Electrical and Computer Engineering, National University of SingaporeVerified email at nus.edu.sg
Christopher DoerrAcacia CommunicationsVerified email at acacia-inc.com
Chuanbowen SunUniversity of MelbourneVerified email at student.unimelb.edu.au
Sethumadhavan ChandrasekharRetired Nokia Bell LabsVerified email at ieee.org