| Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices S Petzold, A Zintler, R Eilhardt, E Piros, N Kaiser, SU Sharath, T Vogel, ... Advanced Electronic Materials 5 (10), 1900484, 2019 | 86 | 2019 |
| Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties N Kaiser, T Vogel, A Zintler, S Petzold, A Arzumanov, E Piros, R Eilhardt, ... ACS Applied Materials & Interfaces 14 (1), 1290-1303, 2021 | 47 | 2021 |
| Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes S Petzold, E Miranda, SU Sharath, J Muñoz-Gorriz, T Vogel, E Piros, ... Journal of applied physics 125 (23), 2019 | 35 | 2019 |
| Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching S Petzold, E Piros, R Eilhardt, A Zintler, T Vogel, N Kaiser, A Radetinac, ... Advanced Electronic Materials 6 (11), 2000439, 2020 | 33 | 2020 |
| Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier E Piros, S Petzold, A Zintler, N Kaiser, T Vogel, R Eilhardt, C Wenger, ... Applied Physics Letters 117 (1), 2020 | 30 | 2020 |
| Electrochemical Reduction and Oxidation of Ruddlesden–Popper-Type La2NiO3F2 within Fluoride-Ion Batteries K Wissel, R Schoch, T Vogel, M Donzelli, G Matveeva, U Kolb, M Bauer, ... Chemistry of Materials 33 (2), 499-512, 2021 | 28 | 2021 |
| Crystal and Electronic Structure of Oxygen Vacancy Stabilized Rhombohedral Hafnium Oxide N Kaiser, YJ Song, T Vogel, E Piros, T Kim, P Schreyer, S Petzold, ... ACS Applied Electronic Materials 5 (2), 754-763, 2023 | 26 | 2023 |
| Role of Oxygen Defects in Conductive-Filament Formation in -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy E Piros, M Lonsky, S Petzold, A Zintler, SU Sharath, T Vogel, N Kaiser, ... Physical Review Applied 14 (3), 034029, 2020 | 20 | 2020 |
| Defect-Induced Phase Transition in Hafnium Oxide Thin Films: Comparing Heavy Ion Irradiation and Oxygen-Engineering Effects T Vogel, N Kaiser, S Petzold, E Piros, N Guillaume, G Lefévre, ... IEEE Transactions on Nuclear Science 68 (8), 1542-1547, 2021 | 17 | 2021 |
| Topochemical Fluorination of n = 2 Ruddlesden–Popper Type Sr3Ti2O7 to Sr3Ti2O5F4 and Its Reductive Defluorination K Wissel, T Vogel, S Dasgupta, AD Fortes, PR Slater, O Clemens Inorganic Chemistry 59 (2), 1153-1163, 2019 | 17 | 2019 |
| Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices T Kim, T Vogel, E Piros, D Nasiou, N Kaiser, P Schreyer, R Winkler, ... Applied Physics Letters 122 (2), 2023 | 16 | 2023 |
| Structural and electrical response of emerging memories exposed to heavy ion radiation T Vogel, A Zintler, N Kaiser, N Guillaume, G Lefèvre, M Lederer, AL Serra, ... ACS nano 16 (9), 14463-14478, 2022 | 15 | 2022 |
| Controlling the Formation of Conductive Pathways in Memristive Devices R Winkler, A Zintler, S Petzold, E Piros, N Kaiser, T Vogel, D Nasiou, ... Advanced Science 9 (33), 2201806, 2022 | 14 | 2022 |
| Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia M Lederer, T Vogel, T Kämpfe, N Kaiser, E Piros, R Olivo, T Ali, S Petzold, ... Journal of Applied Physics 132 (6), 2022 | 8 | 2022 |
| Tightly adhering diamond-like carbon films on copper substrates by oxygen pre-implantation S Flege, R Hatada, T Vogel, E Bruder, M Major, W Ensinger, K Baba Surface and Coatings Technology 335, 134-139, 2018 | 8 | 2018 |
| Heavy Ion Irradiation Effects on Structural and Ferroelectric Properties of HfO2 Films T Kämpfe, T Vogel, R Olivo, M Lederer, N Kaiser, S Petzold, T Ali, ... 2020 Joint Conference of the IEEE International Frequency Control Symposium …, 2020 | 7 | 2020 |
| Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks FL Aguirre, E Piros, N Kaiser, T Vogel, S Petzold, J Gehrunger, T Oster, ... Micromachines 13 (11), 2002, 2022 | 6 | 2022 |
| Revealing the quantum nature of the voltage-induced conductance changes in oxygen engineered yttrium oxide-based RRAM devices FL Aguirre, E Piros, N Kaiser, T Vogel, S Petzold, J Gehrunger, ... Scientific Reports 14 (1), 1122, 2024 | 5 | 2024 |
| Simulation of the effect of material properties on yttrium oxide memristor-based artificial neural networks F Aguirre, E Piros, N Kaiser, T Vogel, S Petzold, J Gehrunger, T Oster, ... APL Machine Learning 1 (3), 2023 | 2 | 2023 |
| Heavy Ions Radiation Effects on 4kb Phase-Change Memory AL Serra, T Vogel, G Lefevre, S Petzold, N Kaiser, G Bourgeois, ... RADECS 2020, 2020 | 2 | 2020 |