| Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ... Microelectronics Reliability 48 (8-9), 1248-1252, 2008 | 77 | 2008 |
| Charging-effects in RF capacitive switches influence of insulating layers composition M Lamhamdi, J Guastavino, L Boudou, Y Segui, P Pons, L Bouscayrol, ... Microelectronics Reliability 46 (9-11), 1700-1704, 2006 | 58 | 2006 |
| Influence of temperature on low-density polyethylene films through conduction measurement L Boudou, J Guastavino Journal of Physics D: Applied Physics 35 (13), 1555, 2002 | 55 | 2002 |
| Silver nanoparticles as a key feature of a plasma polymer composite layer in mitigation of charge injection into polyethylene under dc stress L Milliere, K Makasheva, C Laurent, B Despax, L Boudou, G Teyssedre Journal of Physics D: Applied Physics 49 (1), 015304, 2015 | 46 | 2015 |
| Charge trap spectroscopy in polymer dielectrics: A critical review G Teyssedre, F Zheng, L Boudou, C Laurent Journal of Physics D: Applied Physics, 2021 | 43 | 2021 |
| Dielectric engineering of nanostructured layers to control the transport of injected charges in thin dielectrics K Makasheva, C Villeneuve-Faure, C Bonafos, C Laurent, A Pugliara, ... IEEE Transactions on Nanotechnology 15 (6), 839-848, 2016 | 41 | 2016 |
| Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches A Belarni, M Lamhamdi, P Pons, L Boudou, J Guastavino, Y Segui, ... Microelectronics Reliability 48 (8-9), 1232-1236, 2008 | 39 | 2008 |
| Molecular mobility in amorphous and partially crystalline PEN after isothermal crystallization JJ Martinez-Vega, N Zouzou, L Boudou, J Guastavino IEEE Transactions on Dielectrics and Electrical Insulation 8 (5), 776-784, 2001 | 35 | 2001 |
| Kelvin force microscopy characterization of charging effect in thin a-SiOxNy:H layers deposited in pulsed plasma enhanced chemical vapor deposition process by … C Villeneuve-Faure, K Makasheva, C Bonafos, B Despax, L Boudou, ... Journal of Applied Physics 113 (20), 204102, 2013 | 31 | 2013 |
| Dielectric layers for RF-MEMS switches: design and study of appropriate structures preventing electrostatic charging K Makasheva, B Despax, L Boudou, G Teyssedre IEEE Transactions on Dielectrics and Electrical Insulation 19 (4), 1195-1202, 2012 | 31 | 2012 |
| Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process C Villeneuve-Faure, K Makasheva, L Boudou, G Teyssedre Nanotechnology 27 (24), 245702, 2016 | 28 | 2016 |
| Effect of temperature on space charge formation in low density polyethylene-role of antioxidant L Boudou, V Griseri, J Guastavino, LA Dissado Proceedings of the 2004 IEEE International Conference on Solid Dielectrics …, 2004 | 25 | 2004 |
| Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements C Villeneuve-Faure, L Boudou, K Makasheva, G Teyssedre Nanotechnology 28 (50), 505701, 2017 | 19 | 2017 |
| Effect of trapped space charge on mechanical deformation induced by electric field TT Anh, L Berquez, L Boudou, J Martinez-Vega IEEE Transactions on Dielectrics and Electrical Insulation 18 (5), 1416-1422, 2011 | 19 | 2011 |
| Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms K Makasheva, C Villeneuve-Faure, C Laurent, B Despax, L Boudou, ... Nanotechnology 26 (29), 295704, 2015 | 18 | 2015 |
| Towards 3D charge localization by a method derived from atomic force microscopy: the electrostatic force distance curve C Villeneuve-Faure, L Boudou, K Makasheva, G Teyssedre Journal of Physics D: Applied Physics 47 (45), 455302, 2014 | 17 | 2014 |
| Charge build-up and transport in electron beam irradiated polymers in a new irradiation chamber V Griseri, P Malaval, L Berquez, TA Tung, S Le Roy, L Boudou, ... 2010 Annual Report Conference on Electrical Insulation and Dielectic …, 2010 | 17 | 2010 |
| TiO2-SiO2 mixed oxide deposited by low pressure PECVD: Insights on optical and nanoscale electrical properties M Mitronika, C Villeneuve-Faure, F Massol, L Boudou, W Ravisy, ... Applied Surface Science 541, 148510, 2021 | 16 | 2021 |
| Atomic force microscopy developments for probing space charge at sub-micrometer scale in thin dielectric films C Villeneuve-Faure, L Boudou, K Makasheva, G Teyssedre IEEE Transactions on Dielectrics and Electrical Insulation 23 (2), 713-720, 2016 | 16 | 2016 |
| Physico-chemical observations on polyethylene base resin under the effect of thermal ageing L Boudou, J Guastavino Journal of Physics D: Applied Physics 35 (1), 1, 2001 | 16 | 2001 |
