Small-delay defect detection in the presence of process variations R Tayade, J Abraham Microelectronics journal 39 (8), 1093-1100, 2008 | 64 | 2008 |
On-chip programmable capture for accurate path delay test and characterization R Tayade, JA Abraham 2008 IEEE International Test Conference, 1-10, 2008 | 62 | 2008 |
Critical path selection for delay test considering coupling noise R Tayade, JA Abraham 2008 13th European Test Symposium, 119-124, 2008 | 25 | 2008 |
Analytical model for the impact of multiple input switching noise on timing R Tayade, S Nassif, J Abraham 2008 Asia and South Pacific Design Automation Conference, 514-517, 2008 | 12 | 2008 |
Critical path selection for delay testing considering coupling noise R Tayade, JA Abraham Journal of Electronic Testing 25, 213-223, 2009 | 10 | 2009 |
Fast simulation technique for LDPC code analysis R Tayade Proc. International Conference on Wireless Networks 2004, 707-713, 2004 | 9 | 2004 |
Estimating path delay distribution considering coupling noise RG Tayade, VK Kalyanam, S Nassif, M Orshansky, J Abraham Proceedings of the 17th ACM Great Lakes symposium on VLSI, 61-66, 2007 | 5 | 2007 |
Testing Techniques for Reconfigurable FPGAs P Acharya, R Tayade Testing and Diagnosis of Digital Systems, 0 | 1 | |
Incorporating the effect of delay variability in path based delay testing RG Tayade The University of Texas at Austin, 2009 | | 2009 |
Robustness analysis of linear estimators R Tayade Texas A&M University, 2004 | | 2004 |
Solution of Poisson’s Equation using Monte Carlo Methods R Tayade | | 2000 |
Patrick Girard R TAYADE, J ABRAHAM Proceedings on Pages 139, 144, 0 | | |
ELEN 689-603: Project Progress Report R Tayade | | |