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Saibal Basu
Saibal Basu
Professor
Verified email at barc.gov.in
Title
Cited by
Cited by
Year
Cation insertion reactions of electrochromic tungsten and iridium oxide films
JDE McIntyre, S Basu, WF Peck Jr, WL Brown, WM Augustyniak
Physical Review B 25 (12), 7242, 1982
1011982
Structural correlations in GexSe1− x glasses–a neutron diffraction study
NR Rao, PSR Krishna, S Basu, BA Dasannacharya, KS Sangunni, ...
Journal of non-crystalline solids 240 (1-3), 221-231, 1998
871998
Resonant soft x-ray reflectivity of organic thin films
C Wang, T Araki, B Watts, S Harton, T Koga, S Basu, H Ade
Journal of Vacuum Science & Technology A 25 (3), 575-586, 2007
622007
Fast Response and High Sensitivity of ZnO NanowiresCobalt Phthalocyanine Heterojunction Based H2S Sensor
A Kumar, S Samanta, A Singh, M Roy, S Singh, S Basu, MM Chehimi, ...
ACS Applied Materials & Interfaces 7 (32), 17713-17724, 2015
592015
Kinetics of alloy formation at the interfaces in a Ni-Ti multilayer: X-ray and neutron reflectometry study
S Singh, S Basu, P Bhatt, AK Poswal
Physical Review B—Condensed Matter and Materials Physics 79 (19), 195435, 2009
562009
A new polarized neutron reflectometer at Dhruva for specular and off-specular neutron reflectivity studies
S Basu, S Singh
Journal of Neutron Research 14 (2), 109-120, 2006
502006
Kinetics of interface alloy phase formation at nanometer length scale in ultra-thin films: X-ray and polarized neutron reflectometry
S Singh, M Swain, S Basu
Progress in Materials Science 96, 1-50, 2018
482018
Growth kinetics of intermetallic alloy phase at the interfaces of a Ni/Al multilayer using polarized neutron and x-ray reflectometry
S Singh, S Basu, M Gupta, CF Majkrzak, PA Kienzle
Physical Review B—Condensed Matter and Materials Physics 81 (23), 235413, 2010
472010
Growth of Pd4S, PdS and PdS2 films by controlled sulfurization of sputtered Pd on native oxide of Si
R Bhatt, S Bhattacharya, R Basu, A Singh, U Deshpande, C Surger, ...
Thin Solid Films 539, 41-46, 2013
452013
Study of magnetic iron nitride thin films deposited by high power impulse magnetron sputtering
A Tayal, M Gupta, A Gupta, V Ganesan, L Behera, S Singh, S Basu
Surface and Coatings Technology 275, 264-269, 2015
432015
Proximity effects across oxide-interfaces of superconductor-insulator-ferromagnet hybrid heterostructure
CL Prajapat, S Singh, D Bhattacharya, G Ravikumar, S Basu, S Mattauch, ...
Scientific reports 8 (1), 3732, 2018
372018
Structure and morphology of Cu/Ni film grown by electrodeposition method: A study of neutron reflectivity and AFM
S Singh, S Basu, SK Ghosh
Applied Surface Science 255 (11), 5910-5916, 2009
372009
Structure and morphology of the Ni films grown by different deposition methods
S Singh, S Basu
Surface and Coatings Technology 201 (3-4), 952-957, 2006
322006
Morphology and structural studies of laser treated 45S5 bioactive glass
SS K. Sharma , S. Kedia , A.K. Singh, C.B. Basak, A.K. Chauhan, S. Basu
Journal of Non-Crystalline Solids 440, 43–48, 2016
312016
Seismic risk analysis of Indian peninsula
S Basu, NC Nigam
Proc. 6th World Conf. Earthqu. Engg., New Delhi 1, 782-788, 1977
311977
Effect of interface morphology on intermetallics formation upon annealing of Al–Ni multilayer
M Swain, S Singh, S Basu, M Gupta
Journal of alloys and compounds 576, 257-261, 2013
272013
In-situ X-ray reflectivity study of alkane films grown from the vapor phase
S Basu, SK Satija
Langmuir 23 (16), 8331-8335, 2007
272007
Oxygen induced hysteretic current-voltage characteristics of iron-phthalocyanine thin films
S Samanta, A Singh, AK Debnath, DK Aswal, SK Gupta, JV Yakhmi, ...
Journal of Applied Physics 104 (7), 2008
262008
Superconductivity-induced magnetization depletion in a ferromagnet through an insulator in a ferromagnet–insulator–superconductor hybrid oxide heterostructures
GRSB C. L. Prajapat, Surendra Singh, Amitesh Paul, D. Bhattacharya, M. R ...
Nanoscale 8, 10188, 2016
252016
Electrochemically controlled pitting corrosion in Ni film: A study of AFM and neutron reflectometry
S Singh, S Basu, AK Poswal, RB Tokas, SK Ghosh
Corrosion science 51 (3), 575-580, 2009
232009
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