Big data analytics for intelligent manufacturing systems: A review J Wang, C Xu, J Zhang, R Zhong Journal of Manufacturing Systems, 2021 | 447 | 2021 |
Deformable convolutional networks for efficient mixed-type wafer defect pattern recognition J Wang, C Xu, Z Yang, J Zhang, X Li IEEE Transactions on Semiconductor Manufacturing 33 (4), 587-596, 2020 | 158 | 2020 |
AdaBalGAN: An improved generative adversarial network with imbalanced learning for wafer defective pattern recognition J Wang, Z Yang, J Zhang, Q Zhang, WTK Chien IEEE Transactions on Semiconductor Manufacturing 32 (3), 310-319, 2019 | 148 | 2019 |
A collaborative architecture of the industrial internet platform for manufacturing systems J Wang, C Xu, J Zhang, J Bao, R Zhong Robotics and Computer-Integrated Manufacturing 61, 101854, 2020 | 135 | 2020 |
Bilateral LSTM: A two-dimensional long short-term memory model with multiply memory units for short-term cycle time forecasting in re-entrant manufacturing systems J Wang, J Zhang, X Wang IEEE Transactions on Industrial Informatics 14 (2), 748-758, 2017 | 125 | 2017 |
Big data analytics for forecasting cycle time in semiconductor wafer fabrication system J Wang, J Zhang International Journal of Production Research 54 (23), 7231-7244, 2016 | 118 | 2016 |
A data driven cycle time prediction with feature selection in a semiconductor wafer fabrication system J Wang, J Zhang, X Wang IEEE Transactions on Semiconductor Manufacturing 31 (1), 173-182, 2018 | 98 | 2018 |
A Hybrid CNN–LSTM Algorithm for Online Defect Recognition of CO2 Welding T Liu, J Bao, J Wang, Y Zhang Sensors 18 (12), 4369, 2018 | 94 | 2018 |
Big data driven cycle time parallel prediction for production planning in wafer manufacturing J Wang, J Yang, J Zhang, X Wang, W Zhang Enterprise information systems 12 (6), 714-732, 2018 | 67 | 2018 |
Fog-IBDIS: Industrial big data integration and sharing with fog computing for manufacturing systems J Wang, P Zheng, Y Lv, J Bao, J Zhang Engineering 5 (4), 662-670, 2019 | 58 | 2019 |
Big data analytics for cycle time related feature selection in the semiconductor wafer fabrication system J Wang, P Zheng, J Zhang Computers & Industrial Engineering 143, 106362, 2020 | 52 | 2020 |
Real‐time fabric defect detection based on multi‐scale convolutional neural network S Zhao, L Yin, J Zhang, J Wang, R Zhong IET Collaborative Intelligent Manufacturing 2 (4), 189-196, 2020 | 38 | 2020 |
Big data driven intelligent manufacturing 张洁, 汪俊亮, 吕佑龙, 鲍劲松 China Mechanical Engineering 30 (2), 127-133,158, 2019 | 38 | 2019 |
An Unequal Learning Approach for 3D Point Cloud Segmentation J Wang, C Xu, L Dai, J Zhang, RY Zhong IEEE Transactions on Industrial Informatics 17 (12), 7913-7922, 2020 | 35 | 2020 |
Anomaly detection of power consumption in yarn spinning using transfer learning C Xu, J Wang, J Zhang, X Li Computers & Industrial Engineering 152, 107015, 2021 | 33 | 2021 |
An expert knowledge-empowered CNN approach for welding radiographic image recognition T Liu, H Zheng, P Zheng, J Bao, J Wang, X Liu, C Yang Advanced Engineering Informatics 56, 101963, 2023 | 32 | 2023 |
An adaptive CGAN/IRF-based rescheduling strategy for aircraft parts remanufacturing system under dynamic environment P Zheng, J Wang, J Zhang, C Yang, Y Jin Robotics and Computer-Integrated Manufacturing 58, 230-238, 2019 | 32 | 2019 |
A data-driven robust optimization method for the assembly job-shop scheduling problem under uncertainty P Zheng, P Zhang, J Wang, J Zhang, C Yang, Y Jin International Journal of Computer Integrated Manufacturing 35 (10-11), 1043-1058, 2022 | 29 | 2022 |
Unsupervised fabric defects detection based on spatial domain saliency and features clustering S Zhao, RY Zhong, J Wang, C Xu, J Zhang Computers & Industrial Engineering 185, 109681, 2023 | 25 | 2023 |
Knowledge augmented broad learning system for computer vision based mixed-type defect detection in semiconductor manufacturing J Wang, P Gao, J Zhang, C Lu, B Shen Robotics and Computer-Integrated Manufacturing 81, 102513, 2023 | 25 | 2023 |