Robert P.W. Duin

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David TaxAssistant professor, Delft University of TechnologyVerified email at tudelft.nl
Elżbieta PękalskaPhD, University of ManchesterVerified email at cs.man.ac.uk
Dick de Ridderprofessor bioinformatics, Wageningen University & Research CentreVerified email at wur.nl
Marco LoogRadboud UniversityVerified email at ru.nl
Josef KittlerUniversity of SurreyVerified email at surrey.ac.uk
Alexander YpmaASML Netherlands, B.V.Verified email at asml.com
Anil K. JainMichigan State UniversityVerified email at cse.msu.edu
Mauricio Orozco-AlzateUniversidad Nacional de Colombia - Sede ManizalesVerified email at unal.edu.co
Jianchang (JC) MaoCorporate Vice President, Bing Advertising Products and EngineeringVerified email at microsoft.com
Ludmila KunchevaProfessor of Computer Science, Bangor University, UKVerified email at bangor.ac.uk
Jiri MatasProfessor, Czech Technical UniversityVerified email at cmp.felk.cvut.cz
Cuong DinhBol.com; The Netherlands Cancer InstituteVerified email at bol.com
Lucas J. van VlietProfessor of Multidimensional Image Analysis, Delft University of TechnologyVerified email at TUDelft.NL
Horst BunkeProfessor Emeritus, University of BernVerified email at iam.unibe.ch
Diana Porro MunozData ScientistVerified email at farelogix.com
Yenisel Plasencia CalañaMaastricht UniversityVerified email at maastrichtuniversity.nl
Manuele BicegoUniversità di Verona (Italy)Verified email at univr.it
Edel Garcia ReyesInstitute CCGVerified email at ccg.pt
Ferdinand van der Heijdenassociate professor - University of TwenteVerified email at utwente.nl
Sarunas RaudysProfessor of Computer Science, Vilnius UniversityVerified email at mif.vu.lt

Robert P.W. Duin

Delft University of Technology

Verified email at tudelft.nl - Homepage

pattern recognition artificial intelligence machine learning image processing


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Statistical pattern recognition: A review AK Jain, RPW Duin, J Mao IEEE Transactions on pattern analysis and machine intelligence 22 (1), 4-37, 2000	9616	2000
On combining classifiers J Kittler, M Hatef, RPW Duin, J Matas IEEE transactions on pattern analysis and machine intelligence 20 (3), 226-239, 1998	7772	1998
Support vector data description DMJ Tax, RPW Duin Machine Learning 54 (1), 45-66, 2004	4555	2004
Support vector domain description DMJ Tax, RPW Duin Pattern recognition letters 20 (11-13), 1191-1199, 1999	2206	1999
Decision templates for multiple classifier fusion: an experimental comparison LI Kuncheva, JC Bezdek, RPW Duin Pattern recognition 34 (2), 299-314, 2001	1406	2001
Classification, parameter estimation and state estimation: an engineering approach using MATLAB F Van Der Heijden, RP Duin, D De Ridder, DMJ Tax John Wiley & Sons, 2005	907	2005
The dissimilarity representation for pattern recognition: foundations and applications RPW Duin World scientific, 2005	857	2005
Feed forward neural networks with random weights WF Schmidt, MA Kraaijveld, RPW Duin International conference on pattern recognition, 1-1, 1992	772	1992
Bagging, boosting and the random subspace method for linear classifiers M Skurichina, RPW Duin Pattern Analysis & Applications 5, 121-135, 2002	756	2002
Prtools4. 1, a matlab toolbox for pattern recognition RPW Duin, P Juszczak, P Paclik, E Pekalska, D De Ridder, DMJ Tax, ... Delft University of technology 2600, 2007	743	2007
Data domain description using support vectors. DMJ Tax, RPW Duin ESANN 99, 251-256, 1999	625	1999
Multiclass linear dimension reduction by weighted pairwise Fisher criteria M Loog, RPW Duin, R Haeb-Umbach IEEE transactions on pattern analysis and machine intelligence 23 (7), 762-766, 2001	620	2001
The combining classifier: to train or not to train? RPW Duin 2002 International Conference on Pattern Recognition 2, 765-770, 2002	542	2002
On the choice of smoothing parameters for Parzen estimators of probability density functions Duin IEEE Transactions on computers 100 (11), 1175-1179, 1976	539	1976
Combining multiple classifiers by averaging or by multiplying? DMJ Tax, M Van Breukelen, RPW Duin, J Kittler Pattern recognition 33 (9), 1475-1485, 2000	535	2000
Limits on the majority vote accuracy in classifier fusion LI Kuncheva, CJ Whitaker, CA Shipp, RPW Duin Pattern Analysis & Applications 6, 22-31, 2003	524	2003
A generalized kernel approach to dissimilarity-based classification E Pekalska, P Paclik, RPW Duin Journal of machine learning research 2 (Dec), 175-211, 2001	494	2001
Uniform object generation for optimizing one-class classifiers DMJ Tax, RPW Duin Journal of machine learning research 2 (Dec), 155-173, 2001	452	2001
Prototype selection for dissimilarity-based classifiers E Pękalska, RPW Duin, P Paclík Pattern Recognition 39 (2), 189-208, 2006	433	2006
Supervised locally linear embedding D De Ridder, O Kouropteva, O Okun, M Pietikäinen, RPW Duin International Conference on Artificial Neural Networks, 333-341, 2003	396	2003

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