| Irena: tool suite for modeling and analysis of small-angle scattering J Ilavsky, PR Jemian Journal of Applied Crystallography 42 (2), 347-353, 2009 | 1849 | 2009 |
| Glassy carbon as an absolute intensity calibration standard for small-angle scattering F Zhang, J Ilavsky, GG Long, JPG Quintana, AJ Allen, PR Jemian Metallurgical and Materials Transactions A 41, 1151-1158, 2010 | 484 | 2010 |
| Ultra-small-angle X-ray scattering at the Advanced Photon Source J Ilavsky, PR Jemian, AJ Allen, F Zhang, LE Levine, GG Long Journal of Applied Crystallography 42 (3), 469-479, 2009 | 358 | 2009 |
| Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source J Ilavsky, F Zhang, RN Andrews, I Kuzmenko, PR Jemian, LE Levine, ... Journal of applied crystallography 51 (3), 867-882, 2018 | 191 | 2018 |
| The NeXus data format M Könnecke, FA Akeroyd, HJ Bernstein, AS Brewster, SI Campbell, ... Journal of applied crystallography 48 (1), 301-305, 2015 | 190 | 2015 |
| Ultra-small-angle X-ray scattering instrument at the advanced photon source: history, recent development, and current status J Ilavsky, F Zhang, AJ Allen, LE Levine, PR Jemian, GG Long Metallurgical and Materials Transactions A 44, 68-76, 2013 | 182 | 2013 |
| Determination of phonon dispersions from x-ray transmission scattering: The example of silicon M Holt, Z Wu, H Hong, P Zschack, P Jemian, J Tischler, H Chen, ... Physical review letters 83 (16), 3317, 1999 | 131 | 1999 |
| High-resolution small-angle X-ray scattering camera for anomalous scattering GG Long, PR Jemian, JR Weertman, DR Black, HE Burdette, R Spal Journal of applied crystallography 24 (1), 30-37, 1991 | 122 | 1991 |
| Characterization of 9Cr-1MoVNb steel by anomalous small-angle X-ray scattering PR Jemian, JR Weertman, GG Long, RD Spal Acta metallurgica et materialia 39 (11), 2477-2487, 1991 | 107 | 1991 |
| Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures J Ilavsky, AJ Allen, GG Long, PR Jemian Review of scientific instruments 73 (3), 1660-1662, 2002 | 102 | 2002 |
| Dedicated full-field X-ray imaging beamline at Advanced Photon Source Q Shen, WK Lee, K Fezzaa, YS Chu, F De Carlo, P Jemian, J Ilavsky, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007 | 83 | 2007 |
| Micro-to Nanoscale Structure of Biocompatible PLA− PEO− PLA Hydrogels SK Agrawal, N Sanabria-DeLong, PR Jemian, GN Tew, SR Bhatia Langmuir 23 (9), 5039-5044, 2007 | 78 | 2007 |
| Challenges and opportunities in complex materials: silica-reinforced elastomers DW Schaefer, C Suryawanshi, P Pakdel, J Ilavsky, PR Jemian Physica A: Statistical Mechanics and its Applications 314 (1-4), 686-695, 2002 | 61 | 2002 |
| Quantitative measurement of nanoparticle halo formation around colloidal microspheres in binary mixtures F Zhang, GG Long, PR Jemian, J Ilavsky, VT Milam, JA Lewis Langmuir 24 (13), 6504-6508, 2008 | 59 | 2008 |
| High-energy ultra-small-angle X-ray scattering instrument at the advanced photon source J Ilavsky, AJ Allen, LE Levine, F Zhang, PR Jemian, GG Long Journal of Applied Crystallography 45 (6), 1318-1320, 2012 | 52 | 2012 |
| Non-cavitation tensile creep in Lu-doped silicon nitride F Lofaj, SM Wiederhorn, GG Long, BJ Hockey, PR Jemian, L Browder, ... Journal of the European Ceramic Society 22 (14-15), 2479-2487, 2002 | 41 | 2002 |
| Silicon photodiode detector for small-angle x-ray scattering PR Jemian, GG Long Journal of applied crystallography 23 (5), 430-432, 1990 | 32 | 1990 |
| Tensile creep in the next generation silicon nitride FŠE Lofaj, SM Wiederhorn, GG Long, PR Jemian 25th Annual Conference on Composites, Advanced Ceramics, Materials, and …, 2001 | 31 | 2001 |
| Small-angle-scattering determination of the microstructure of porous silica precursor bodies GG Long, S Krueger, PR Jemian, DR Black, HE Burdette, JP Cline, ... Journal of applied crystallography 23 (6), 535-544, 1990 | 31 | 1990 |
| In situ ultra-small-angle X-ray scattering study of the solution-mediated formation and growth of nanocrystalline ceria AJ Allen, VA Hackley, PR Jemian, J Ilavsky, JM Raitano, SW Chan Journal of Applied Crystallography 41 (5), 918-929, 2008 | 30 | 2008 |
