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James Read
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Pulse-based capacitive memory window with high non-destructive read endurance in fully BEOL compatible ferroelectric capacitors
S Mukherjee, J Bizindavyi, YC Luo, S Clima, J Read, MI Popovici, Y Xiang, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
132023
H3datten: Heterogeneous 3-d integrated hybrid analog and digital compute-in-memory accelerator for vision transformer self-attention
W Li, M Manley, J Read, A Kaul, MS Bakir, S Yu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023
122023
A 40nm RRAM compute-in-memory macro with parallelism-preserving ECC for iso-accuracy voltage scaling
W Li, J Read, H Jiang, S Yu
ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC …, 2022
82022
Mac-ecc: In-situ error correction and its design methodology for reliable nvm-based compute-in-memory inference engine
W Li, J Read, H Jiang, S Yu
IEEE Journal on Emerging and Selected Topics in Circuits and Systems 12 (4 …, 2022
62022
A method for reverse engineering neural network parameters from compute-in-memory accelerators
J Read, W Li, S Yu
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 302-307, 2022
62022
A cross-layer framework for design space and variation analysis of non-volatile ferroelectric capacitor-based compute-in-memory accelerators
YC Luo, J Read, A Lu, S Yu
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 159-164, 2024
52024
In-Situ Encrypted NAND FeFET Array for Secure Storage and Compute-in-Memory
Z Zhao, Y Xu, J Read, PK Hsu, Y Qin, TJ Huang, S Lim, K Kim, K Kim, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
42023
Engineering nvCap From FEOL to BEOL with Ferroelectric Small-signal Non-destructive Read
TH Kim, YC Luo, O Phadke, J Read, S Yu
2024 IEEE International Memory Workshop (IMW), 1-4, 2024
22024
Total ionizing dose effect in tri-gate silicon ferroelectric transistor memory
KA Aabrar, J Read, SG Kirtania, S Stepanoff, DE Wolfe, S Yu, S Datta
2022 International Electron Devices Meeting (IEDM), 32.7. 1-32.7. 4, 2022
22022
Co-Optimization for Robust Power Delivery Design in 3D-Heterogeneous Integration of Compute In-Memory Accelerators
A Kaul, M Manley, J Read, Y Luo, X Peng, S Yu, M Bakir
2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2024
12024
Enabling Long-Term Robustness in RRAM-based Compute-In-Memory Edge Devices
J Read, W Li, S Yu
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023
12023
Co-Optimization of Power Delivery Network Design for 3D Heterogeneous Integration of RRAM-based Compute In-Memory Accelerators
M Manley, J Read, A Kaul, S Yu, M Bakir
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2025
2025
Capacitive Synaptor with Gate Surrounding Semiconductor Pillar Structure and Overturned Charge Injection for Compute‐in‐Memory
CK Kim, J Read, M Shon, TH Kim, MS Kim, JM Yu, MS Yoo, YK Choi, S Yu
Advanced Intelligent Systems, 2400371, 2024
2024
Laboratory for Emerging Devices and Circuits
MY Lee, J Read, J Lee, A Lu, X Peng, S Huang, Y Luo, PY Chen, S Yu
MAC-ECC: In-Situ Error Correction and
W Li, J Read, H Jiang, S Yu
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