Modular microreactor with integrated reflection element for online reaction monitoring using infrared spectroscopy JJA Lozeman, T Elsbecker, S Bohnenn, HL de Boer, M Krakers, G Mul, ... Lab on a Chip 20 (22), 4166-4174, 2020 | 11 | 2020 |
Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range T Knežević, M Krakers, LK Nanver Optical Components and Materials XVII 11276, 73-85, 2020 | 7 | 2020 |
2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) M Krakers, T Kneevic, LK Nanver IEEE, 2019 | 7 | 2019 |
Reverse breakdown and light-emission patterns studied in Si PureB SPADs M Krakers, T Kneevic, LK Nanver 2019 42nd International Convention on Information and Communication …, 2019 | 5 | 2019 |
On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology LK Nanver, T Knezevic, X Liu, SD Thammaiah, M Krakers Journal of nanoscience and nanotechnology 21 (4), 2472-2482, 2021 | 3 | 2021 |
Diode design for studying material defect distributions with avalanche–mode light emission M Krakers, T Knezevic, KM Batenburg, X Liu, LK Nanver 2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020 | 3 | 2020 |
Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices LK Nanver, M Krakers, T Knezević, A Karavidas, I Boturchuk, V Agarwal, ... Fifth Conference on Sensors, MEMS, and Electro-Optic Systems 11043, 40-53, 2019 | 3 | 2019 |
Optoelectrical operation stability of broadband PureGaB Ge-on-Si photodiodes with anomalous Al-mediated sidewall contacting M Krakers, T Knežević, LK Nanver Journal of Electronic Materials 50, 7026-7036, 2021 | 2 | 2021 |