Semiconductor structure including a ferroelectric transistor and method for the formation thereof R Van Bentum, J Yun, SEO Seunghwan, J Schmid US Patent 9,293,556, 2016 | 33 | 2016 |
Low-variation SRAM bitcells in 22nm FDSOI technology V Joshi, H Ramamurthy, S Balasubramanian, S Seo, H Yoon, X Zou, ... 2017 Symposium on VLSI Technology, T222-T223, 2017 | 15 | 2017 |
Design of a robust analog-to-digital converter based on complementary SET/CMOS hybrid amplifier CH Lee, SW Kim, JU Lee, SH Seo, GC Kang, KS Roh, KY Kim, SY Lee, ... IEEE Transactions on Nanotechnology 6 (6), 667-675, 2007 | 15 | 2007 |
Dynamic bias temperature instability-like behaviors under Fowler–Nordheim program/erase stress in nanoscale silicon-oxide-nitride-oxide-silicon memories SH Seo, GC Kang, KS Roh, KY Kim, S Lee, KJ Song, CM Choi, SR Park, ... Applied Physics Letters 92 (13), 2008 | 13 | 2008 |
Method and apparatus for bit-line sensing gates on an SRAM cell SEO Seunghwan, J Yun US Patent 9,224,455, 2015 | 9 | 2015 |
Semiconductor structure including a ferroelectric transistor and method for the formation thereof R Van Bentum, J Yun, SEO Seunghwan, J Schmid US Patent 9,536,992, 2017 | 8 | 2017 |
Optical capacitance-voltage characterization of charge traps in the trapping nitride layer of charge trapped flash memory devices JU Lee, KS Roh, GC Kang, SH Seo, KY Kim, S Lee, KJ Song, CM Choi, ... Applied Physics Letters 91 (22), 2007 | 8 | 2007 |
Sub-bandgap optical GIDL current method for extracting the interface states in the gate-to-drain overlapped region of MOSFETs JB Choi, SH Seo, JU Lee, GC Kang, SW Kim, KS Roh, KY Kim, CH Lee, ... Journal of the Korean Physical Society 49 (4), 1565, 2006 | 5 | 2006 |
Novel back gate doping ultra low retention power 22nm FDSOL SRAM for IoT application M Chang, N Chan, V Joshi, S Hecker, U Ziller, P Poth, A Zaka, ... 2018 48th European Solid-State Device Research Conference (ESSDERC), 78-81, 2018 | 3 | 2018 |
Investigation of the channel-width dependence of CHEI program/HHI erase cycling behavior in nitride-based charge-trapping flash (CTF) memory devices SH Seo, SW Kim, JU Lee, GC Kang, KS Roh, KY Kim, S Lee, CM Choi, ... Journal of the Korean Physical Society 52 (2), 481-486, 2008 | 3 | 2008 |
Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories SH Seo, SW Kim, JU Lee, GC Kang, KS Roh, KY Kim, SY Lee, CM Choi, ... Solid-state electronics 52 (6), 844-848, 2008 | 2 | 2008 |
Extraction of interface states at emitter–base heterojunctions in AlGaAs/GaAs heterostructure bipolar transistors using sub-bandgap photonic excitation SW Kim, KS Roh, SH Seo, KY Kim, GC Kang, S Lee, CM Choi, SR Park, ... Microelectronics Reliability 48 (3), 382-388, 2008 | 2 | 2008 |
Comparative Study on Circuit Performance Depending on Double-Gate (DG) and Triple-Gate (TG) FinFET Structure KY Kim, SR Park, SH Seo, GC Kang, KS Roh, S Lee, KJ Song, CM Choi, ... 2008 15th Korean Conference on Semiconductors, 2008 | 2 | 2008 |
Optical charge pumping technique for extracting interface states of nano-scale SONOS flash memories S Lee, KC Jeon, JU Lee, SW Kim, SH Seo, KS Roh, GC Kang, KY Kim, ... Journal of the Korean Physical Society 51 (6), 2063-268, 2007 | 2 | 2007 |
Comparative Study on Program/Erase Efficiency of 3-D SONOS Flash Memory Cell Transistor: Structural Approach from Multi-Gate (MG) to Gate-All-Around (GAA) FET SR Park, KY Kim, JH Park, SH Seo, GC Kang, KS Roh, S Lee 2008 15th Korean Conference on Semiconductors, 2008 | 1 | 2008 |
Optical Charge Pumping Method for Extracting the Energy Level of Interface States in Program/Erase Cycled SONOS Flash Memory Cell and Its Program Time Dependence K Jeon, S Lee, SH Seo, KS Roh, GC Kang, KY Kim, CM Choi, KJ Song, ... 2008 15th Korean Conference on Semiconductors, 2008 | 1 | 2008 |
Hole Influence on Both the Degradation of Erase Efficiency and the Dynamic BTI-like Behavior in Program/Erase Cycled NAND-type Nitride-Based Charge Trapping Flash Memories DH Kim, DM Kim, SH Seo 2008 15th Korean Conference on Semiconductors, 2008 | | 2008 |
Novel Flat Band Voltage Extraction using Optical Substrate Current and Lateral Profiling of Trapped Charges in Localized Charge Trapping Flash Memory Cells KS Roh, GC Kang, SH Seo, KY Kim, KJ Song, JH Park, S Lee, CM Choi, ... 2008 15th Korean Conference on Semiconductors, 2008 | | 2008 |
Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Electron devices: 第 15 回先端半導体デバイ … SY Lee, JU Lee, SH Seo, KS Roh, GC Kang, KY Kim, CM Choi, KJ Song, ... 2007 Asia-Pacific Workshop on Fundamentals and Application of Advanced …, 2007 | | 2007 |
Sub-bandgap photonic base current method for extracting the trap density at heterointerfaces in heterojunction bipolar transistors SW Kim, JU Lee, GC Kang, KS Roh, SH Seo, KY Kim, CH Lee, SY Lee, ... Journal of the Korean Physical Society 49 (4), 1558, 2006 | | 2006 |