| A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants MH Park, T Schenk, CM Fancher, ED Grimley, C Zhou, C Richter, ... Journal of Materials Chemistry C 5 (19), 4677-4690, 2017 | 324 | 2017 |
| Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity A Biancoli, CM Fancher, JL Jones, D Damjanovic Nature materials 14 (2), 224-229, 2015 | 226 | 2015 |
| TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films PD Lomenzo, Q Takmeel, C Zhou, CM Fancher, E Lambers, ... Journal of Applied Physics 117 (13), 2015 | 201 | 2015 |
| Si doped hafnium oxide—a “fragile” ferroelectric system C Richter, T Schenk, MH Park, FA Tscharntke, ED Grimley, JM LeBeau, ... Advanced Electronic Materials 3 (10), 1700131, 2017 | 184 | 2017 |
| Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes PD Lomenzo, P Zhao, Q Takmeel, S Moghaddam, T Nishida, M Nelson, ... Journal of Vacuum Science & Technology B 32 (3), 2014 | 147 | 2014 |
| On the Origin of the Large Remanent Polarization in La:HfO2 T Schenk, CM Fancher, MH Park, C Richter, C Künneth, A Kersch, ... Advanced Electronic Materials 5 (12), 1900303, 2019 | 121 | 2019 |
| Ferroelectric Si-Doped HfO2 Device Properties on Highly Doped Germanium PD Lomenzo, Q Takmeel, CM Fancher, C Zhou, NG Rudawski, ... IEEE Electron Device Letters 36 (8), 766-768, 2015 | 86 | 2015 |
| The effects of layering in ferroelectric Si-doped HfO2 thin films PD Lomenzo, Q Takmeel, C Zhou, Y Liu, CM Fancher, JL Jones, ... Applied Physics Letters 105 (7), 2014 | 66 | 2014 |
| LIPRAS: Line-profile analysis software G Esteves, K Ramos, CM Fancher, JL Jones Preprint at https://www. researchgate. net/publication/316985889_LIPRAS_Line …, 2017 | 60 | 2017 |
| Al-Cu-Ce (-Zr) alloys with an exceptional combination of additive processability and mechanical properties S Bahl, K Sisco, Y Yang, F Theska, S Primig, LF Allard, RA Michi, ... Additive Manufacturing 48, 102404, 2021 | 59 | 2021 |
| The contribution of 180 domain wall motion to dielectric properties quantified from in situ X-ray diffraction CM Fancher, S Brewer, CC Chung, S Röhrig, T Rojac, G Esteves, ... Acta materialia 126, 36-43, 2017 | 59 | 2017 |
| Effective residual stress prediction validated with neutron diffraction method for metal large-scale additive manufacturing A Nycz, Y Lee, M Noakes, D Ankit, C Masuo, S Simunovic, J Bunn, L Love, ... Materials & Design 205, 109751, 2021 | 56 | 2021 |
| In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films M Wallace, RL Johnson-Wilke, G Esteves, CM Fancher, RHT Wilke, ... Journal of Applied Physics 117 (5), 2015 | 54 | 2015 |
| Effect of Texture on Temperature‐Dependent Properties of K0.5Na0.5NbO3 Modified Bi1/2Na1/2TiO3–xBaTiO3 CM Fancher, W Jo, J Rödel, JE Blendell, KJ Bowman Journal of the American Ceramic Society 97 (8), 2557-2563, 2014 | 47 | 2014 |
| Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, TE Chan, ... Microscopy and Microanalysis 21 (4), 946-952, 2015 | 46 | 2015 |
| Current capabilities of the residual stress diffractometer at the high flux isotope reactor P Cornwell, J Bunn, CM Fancher, EA Payzant, CR Hubbard Review of Scientific Instruments 89 (9), 2018 | 42 | 2018 |
| Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading G Esteves, CM Fancher, S Röhrig, GA Maier, JL Jones, M Deluca Acta materialia 132, 96-105, 2017 | 41 | 2017 |
| Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system DK Khatua, L KV, CM Fancher, JL Jones, R Ranjan Physical Review B 93 (10), 104103, 2016 | 38 | 2016 |
| In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction G Esteves, CM Fancher, JL Jones Journal of Materials Research 30 (3), 340-356, 2015 | 38 | 2015 |
| Use of Bayesian inference in crystallographic structure refinement via full diffraction profile analysis CM Fancher, Z Han, I Levin, K Page, BJ Reich, RC Smith, AG Wilson, ... Scientific reports 6 (1), 31625, 2016 | 37 | 2016 |
Jacob L. JonesMaterials Science & Engineering, North Carolina State UniversityVerified email at ncsu.edu
