| Demonstration of 4.7 kV breakdown voltage in NiO/β-Ga2O3 vertical rectifiers JS Li, CC Chiang, X Xia, TJ Yoo, F Ren, H Kim, SJ Pearton Applied Physics Letters 121 (4), 2022 | 99 | 2022 |
| Annealing temperature dependence of band alignment of NiO/β-Ga2O3 X Xia, JS Li, CC Chiang, TJ Yoo, F Ren, H Kim, SJ Pearton Journal of Physics D: Applied Physics 55 (38), 385105, 2022 | 44 | 2022 |
| Atomic-scale characterization of structural damage and recovery in Sn ion-implanted β-Ga2O3 T Yoo, X Xia, F Ren, A Jacobs, MJ Tadjer, S Pearton, H Kim Applied Physics Letters 121 (7), 2022 | 32 | 2022 |
| Reproducible NiO/Ga2O3 Vertical Rectifiers with Breakdown Voltage > 8 kV JS Li, HH Wan, CC Chiang, X Xia, TJ Yoo, H Kim, F Ren, SJ Pearton Crystals 13 (6), 886, 2023 | 27 | 2023 |
| Breakdown up to 13.5 kV in NiO/β-Ga2O3 vertical heterojunction rectifiers JS Li, HH Wan, CC Chiang, TJ Yoo, MH Yu, F Ren, H Kim, YT Liao, ... ECS Journal of Solid State Science and Technology 13 (3), 035003, 2024 | 22 | 2024 |
| NiO/Ga2O3 Vertical Rectifiers of 7 kV and 1 mm2 with 5.5 A Forward Conduction Current JS Li, HH Wan, CC Chiang, TJ Yoo, F Ren, H Kim, SJ Pearton Crystals 13 (12), 1624, 2023 | 6 | 2023 |
| Thermal stability of band offsets of NiO/GaN X Xia, JS Li, CC Chiang, TJ Yoo, F Ren, H Kim, SJ Pearton Journal of Vacuum Science & Technology A 40 (5), 2022 | 6 | 2022 |
| Uniaxial magnetic anisotropy in three-bilayer Co/Cu and Co/Al superlattices Y Xia, T Yoo, Y Xiang, Y Zhang, JJ Kim, TS Kuan, GC Wang Thin Solid Films 681, 32-40, 2019 | 6 | 2019 |
| High-quality epitaxial thin films of topological kagome metal CoSn by magnetron sputtering TR Thapaliya, T Yoo, S Hurtado Parra, ND Arndt, RF Need, JM Kikkawa, ... Applied Physics Letters 119 (20), 2021 | 5 | 2021 |
| Vertical NiO/β-Ga2O3 rectifiers grown by metalorganic chemical vapor deposition HH Wan, JS Li, CC Chiang, F Ren, TJ Yoo, H Kim, A Osinsky, F Alema, ... Journal of Vacuum Science & Technology A 41 (5), 2023 | 4 | 2023 |
| Unsupervised machine learning and cepstral analysis with 4D-STEM for characterizing complex microstructures of metallic alloys T Yoo, E Hershkovitz, Y Yang, F da Cruz Gallo, MV Manuel, H Kim npj Computational Materials 10 (1), 223, 2024 | 2 | 2024 |
| Structural anisotropy in Sb thin films P Adhikari, A Wijesinghe, A Rathore, TJ Yoo, G Kim, S Yeom, HT Lee, ... APL Materials 12 (1), 2024 | 1 | 2024 |
| E-mode AlGaN/GaN HEMTs using p-NiO gates CC Chiang, HH Wan, JS Li, F Ren, TJ Yoo, H Kim, SJ Pearton Journal of Vacuum Science & Technology B 41 (6), 2023 | 1 | 2023 |
| Unveiling Nanoscale Coherent Precipitates and their Strain Fields in NiTiHf-based Shape Memory Alloys Using 4D-STEM E Hershkovitz, Y Yang, T Yoo, F da Cruz Gallo, MV Manuel, H Kim Microscopy and Microanalysis 29 (Supplement_1), 332-333, 2023 | 1 | 2023 |
| Type II band alignment of NiO/α-Ga2O3 for annealing temperatures up to 600° C X Xia, JS Li, CC Chiang, TJ Yoo, E Hershkovitz, F Ren, H Kim, J Kim, ... Journal of Vacuum Science & Technology A 40 (6), 2022 | 1 | 2022 |
| Unveiling and mapping polymorphs in fluorite Y2TiO5 using 4D‐STEM and unsupervised machine learning E Hershkovitz, T Yoo, X Pu, K Bawane, T Nakayama, H Suematsu, L He, ... Journal of the American Ceramic Society, e20309, 2024 | | 2024 |
| Demonstration of Record Breakdown up to 13.5 kV in NiO/β-Ga2O3 Vertical Rectifiers JS Li, HH Wan, CC Chiang, TJ Yoo, MH Yu, F Ren, H Kim, YT Liao, ... 2024 Device Research Conference (DRC), 1-2, 2024 | | 2024 |
| E-Mode AlGaN/GaN HEMTs Using p-NiO Gates CC Chiang, HH Wan, JS Li, F Ren, TJ Yoo, H Kim, SJ Pearton ECS Transactions 113 (7), 45, 2024 | | 2024 |
| Control of the Structural Phases of Tin (Sn) thin films Through Lattice Engineering C Edirisinghe, A Rathore, AH Chen, A Wijesinghe, P Adhikari, T Yoo, ... Bulletin of the American Physical Society, 2024 | | 2024 |
| Leveraging Multimodal Data Analytics With Advanced Electron Microscopy to Obtain Quantitative Structural Insights into Complex Materials TJ Yoo University of Florida, 2024 | | 2024 |
Gwo-Ching WangRensselaer Polytechnic InstituteVerified email at rpi.edu