| Predicting future product performance: Modeling and evaluation of standard cells in FinFET technologies VB Kleeberger, H Graeb, U Schlichtmann Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 56 | 2013 |
| A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits VB Kleeberger, M Barke, C Werner, D Schmitt-Landsiedel, ... Microelectronics Reliability 54 (6-7), 1083-1089, 2014 | 52 | 2014 |
| Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience A Herkersdorf, H Aliee, M Engel, M Glaß, C Gimmler-Dumont, J Henkel, ... Microelectronics Reliability 54 (6-7), 1066-1074, 2014 | 44 | 2014 |
| A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience V Kleeberger, C Gimmler-Dumont, C Weis, A Herkersdorf, ... IEEE Micro 33 (4), 46-55, 2013 | 34 | 2013 |
| Workload-and instruction-aware timing analysis: The missing link between technology and system-level resilience VB Kleeberger, PR Maier, U Schlichtmann Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 27 | 2014 |
| Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling A Masrur, P Kindt, M Becker, S Chakraborty, V Kleeberger, M Barke, ... IEEE International Conference on Embedded and Real-Time Computing Systems …, 2012 | 27 | 2012 |
| Goldilocks Failures: Not Too Soft, Not Too Hard SR Nassif, VB Kleeberger, U Schlichtmann IEEE International Reliability Physics Symposium (IRPS), 2012 | 23 | 2012 |
| Cross-Layer Dependability Modeling and Abstraction in System on Chip A Herkersdorf, M Engel, M Glaß, J Henkel, V Kleeberger, M Kochte, ... Silicon Errors in Logic - System Effects, 2013 | 17 | 2013 |
| Design & verification of automotive SoC firmware VB Kleeberger, S Rutkowski, R Coppens Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015 | 14 | 2015 |
| Technology-aware system failure analysis in the presence of soft errors by mixture importance sampling VB Kleeberger, D Mueller-Gritschneder, U Schlichtmann 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2013 | 14 | 2013 |
| FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies S Karapetyan, V Kleeberger, U Schlichtmann Microelectronics Reliability 61, 30-34, 2016 | 12 | 2016 |
| Connecting different worlds—Technology abstraction for reliability-aware design and Test U Schlichtmann, VB Kleeberger, JA Abraham, A Evans, ... 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-8, 2014 | 12 | 2014 |
| Fast and waveform independent characterization of current source models C Knoth, VB Kleeberger, P Nordholz, U Schlichtmann 2009 IEEE Behavioral Modeling and Simulation Workshop, 90-95, 2009 | 10 | 2009 |
| Embedded software reliability testing by unit-level fault injection PR Maier, D Mueller-Gritschneder, U Schlichtmann, VB Kleeberger 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC), 410-416, 2016 | 8 | 2016 |
| Fault Injection for Test-driven Development of Robust SoC Firmware PR Maier, VB Kleeberger, D Mueller-Gritschneder, U Schlichtmann ACM Transactions on Embedded Computing Systems (TECS) 17, 2017 | 7 | 2017 |
| Analysis of Aging Mitigation Techniques for Digital Circuits Considering Recovery Effects M Barke, V Kleeberger, C Werner, D Schmitt-Landsiedel, U Schlichtmann edaWorkshop 13, 19-24, 2013 | 7 | 2013 |
| Fault Injection at Host-Compiled Level with Static Fault Set Reduction for SoC Firmware Robustness Testing PR Maier, V Kleeberger, D Mueller-Gritschneder, U Schlichtmann Hardware/Software Codesign and System Synthesis (CODES+ ISSS), 2016 …, 2016 | 4 | 2016 |
| Application-aware cross-layer reliability analysis and optimization M Glaß, H Aliee, L Chen, M Ebrahimi, F Khosravi, VB Kleeberger, A Listl, ... it-Information Technology 57 (3), 159-169, 2015 | 4 | 2015 |
| Program-aware circuit level timing analysis VB Kleeberger, S Kiesel, U Schlichtmann, S Chakraborty 2011 International Symposium on Integrated Circuits, 102-105, 2011 | 4 | 2011 |
| Reliability analysis of digital circuits considering intrinsic noise VB Kleeberger, U Schlichtmann 2011 3rd Asia Symposium on Quality Electronic Design (ASQED), 167-173, 2011 | 4 | 2011 |