| TBar: Revisiting template-based automated program repair K Liu, A Koyuncu, D Kim, TF Bissyandé Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019 | 385 | 2019 |
| Fixminer: Mining relevant fix patterns for automated program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon Empirical Software Engineering 25, 1980-2024, 2020 | 267 | 2020 |
| Automated testing of android apps: A systematic literature review P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein IEEE Transactions on Reliability 68 (1), 45-66, 2018 | 259 | 2018 |
| Avatar: Fixing semantic bugs with fix patterns of static analysis violations K Liu, A Koyuncu, D Kim, TF Bissyandé 2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019 | 225 | 2019 |
| You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon 2019 12th IEEE conference on software testing, validation and verification …, 2019 | 192 | 2019 |
| On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ... Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 180 | 2020 |
| Mining fix patterns for findbugs violations K Liu, D Kim, TF Bissyandé, S Yoo, Y Le Traon IEEE Transactions on Software Engineering 47 (1), 165-188, 2018 | 170 | 2018 |
| Learning to spot and refactor inconsistent method names K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019 | 146 | 2019 |
| Evaluating representation learning of code changes for predicting patch correctness in program repair H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020 | 130 | 2020 |
| iFixR: Bug report driven program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon Proceedings of the 2019 27th ACM joint meeting on european software …, 2019 | 120 | 2019 |
| A critical review on the evaluation of automated program repair systems K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé Journal of Systems and Software 171, 110817, 2021 | 102 | 2021 |
| LSRepair: Live search of fix ingredients for automated program repair K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé 2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018 | 88 | 2018 |
| A closer look at real-world patches K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon 2018 IEEE International Conference on Software Maintenance and Evolution …, 2018 | 67 | 2018 |
| Exploring how deprecated python library apis are (not) handled J Wang, L Li, K Liu, H Cai Proceedings of the 28th acm joint meeting on european software engineering …, 2020 | 58 | 2020 |
| The best of both worlds: integrating semantic features with expert features for defect prediction and localization C Ni, W Wang, K Yang, X Xia, K Liu, D Lo Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022 | 48 | 2022 |
| D&c: A divide-and-conquer approach to ir-based bug localization A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon arXiv preprint arXiv:1902.02703, 2019 | 37 | 2019 |
| The best of both worlds: Combining learned embeddings with engineered features for accurate prediction of correct patches H Tian, K Liu, Y Li, AK Kaboré, A Koyuncu, A Habib, L Li, J Wen, J Klein, ... ACM Transactions on Software Engineering and Methodology 32 (4), 1-34, 2023 | 36 | 2023 |
| Is this change the answer to that problem? correlating descriptions of bug and code changes for evaluating patch correctness H Tian, X Tang, A Habib, S Wang, K Liu, X Xia, J Klein, TF Bissyandé Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022 | 33 | 2022 |
| Predicting patch correctness based on the similarity of failing test cases H Tian, Y Li, W Pian, AK Kabore, K Liu, A Habib, J Klein, TF Bissyandé ACM Transactions on Software Engineering and Methodology (TOSEM) 31 (4), 1-30, 2022 | 33 | 2022 |
| Towards automatically repairing compatibility issues in published Android apps Y Zhao, L Li, K Liu, J Grundy Proceedings of the 44th International Conference on Software Engineering …, 2022 | 33 | 2022 |
Tegawendé F. BissyandéChief Scientist II / ERC Fellow / TruX @SnT, University of LuxembourgVerified email at uni.lu
