Hybrid TFET-MOSFET circuit: A solution to design soft-error resilient ultra-low power digital circuit M Hemmat, M Kamal, A Afzali-Kusha, M Pedram Integration, the VLSI Journal 57, 11-19, 2017 | 11 | 2017 |
AI: Distributed Inference with Local Edge Devices and Minimal Latency M Hemmat, A Davoodi, YH Hu 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 544-549, 2022 | 10 | 2022 |
CAP'NN: Class-aware Personalized Neural Network Inference M Hemmat, J San Miguel, A Davoodi Design Automation Conference (DAC), 2020 | 8 | 2020 |
AirNN: A Featherweight Framework for Dynamic Input-Dependent Approximation of CNNs M Hemmat, J San Miguel, A Davoodi IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020 | 6 | 2020 |
Study on the impact of device parameter variations on performance of III-V homojunction and heterojunction tunnel FETs M Hemmat, M Kamal, A Afzali-Kusha, M Pedram Solid-State Electronics 124, 46-53, 2016 | 6 | 2016 |
Dynamic Reconfiguration of CNNs for Input-dependent Approximation M Hemmat, A Davoodi 20th International Symposium on Quality Electronic Design (ISQED), IEEE, 176-182, 2019 | 5 | 2019 |
Hybrid TFET-MOSFET circuits: An approach to design reliable ultra-low power circuits in the presence of process variation M Hemmat, M Kamal, A Afzali-Kusha, M Pedram 2016 IFIP/IEEE International Conference on Very Large Scale Integration …, 2016 | 5 | 2016 |
Power-efficient ReRAM-aware CNN model generation M Hemmat, A Davoodi Integration, the VLSI Journal, 2019 | 3 | 2019 |
Power-efficient ReRAM-aware CNN model generation. M Hemmat, A Davoodi IEEE International Conference on Computer Design (ICCD), 156 - 162, 2018 | 3 | 2018 |
CRANIA: Unlocking Data and Value Reuse in Iterative Neural Network Architectures M Hemmat, T Shah, Y Chen, J San Miguel Asia and South Pacific Design Automation Conference (ASP-DAC), 2020 | 2 | 2020 |
CAP’NN: A Class-aware Framework for Personalized Neural Network Inference M Hemmat, JS Miguel, A Davoodi ACM Transactions on Embedded Computing Systems 21 (5), 1-24, 2022 | 1 | 2022 |
Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors M Hemmat, M Kamal, A Afzali-Kusha, M Pedram IFIP/IEEE International Conference on Very Large Scale Integration-System on …, 2016 | | 2016 |