| Direct Measurement of the Thickness-Dependent Electronic Band Structure of <?format ?>Using Angle-Resolved Photoemission Spectroscopy W Jin, PC Yeh, N Zaki, D Zhang, JT Sadowski, A Al-Mahboob, ... Physical review letters 111 (10), 106801, 2013 | 640 | 2013 |
| Layer-dependent electronic structure of an atomically heavy two-dimensional dichalcogenide PC Yeh, W Jin, N Zaki, D Zhang, JT Liou, JT Sadowski, A Al-Mahboob, ... Physical Review B 91 (4), 041407, 2015 | 129 | 2015 |
| Substrate interactions with suspended and supported monolayer : Angle-resolved photoemission spectroscopy W Jin, PC Yeh, N Zaki, D Zhang, JT Liou, JT Sadowski, A Barinov, ... Physical Review B 91 (12), 121409, 2015 | 75 | 2015 |
| Resolving the growth of 3D colloidal nanoparticle superlattices by real-time small-angle X-ray scattering C Lu, AJ Akey, CJ Dahlman, D Zhang, IP Herman Journal of the American Chemical Society 134 (45), 18732-18738, 2012 | 42 | 2012 |
| Probing substrate-dependent long-range surface structure of single-layer and multilayer by low-energy electron microscopy and microprobe diffraction PC Yeh, W Jin, N Zaki, D Zhang, JT Sadowski, A Al-Mahboob, ... Physical Review B 89 (15), 155408, 2014 | 24 | 2014 |
| Passivation of CdSe Quantum Dots by Graphene and MoS2 Monolayer Encapsulation D Zhang, DZR Wang, R Creswell, C Lu, J Liou, IP Herman Chemistry of Materials 27 (14), 5032-5039, 2015 | 20 | 2015 |
| Small angle x-ray scattering of iron oxide nanoparticle monolayers formed on a liquid surface D Zhang, C Lu, J Hu, SW Lee, F Ye, IP Herman The Journal of Physical Chemistry C 119 (19), 10727-10733, 2015 | 17 | 2015 |
| Rapid and multi-step, patterned electrophoretic deposition of nanocrystals using electrodes covered with dielectric barriers S Whan Lee, D Zhang, IP Herman Applied Physics Letters 104 (5), 2014 | 15 | 2014 |
| Current-controlled negative differential resistance effect induced by Gunn-type instability in n-type GaN epilayers N Ma, B Shen, FJ Xu, LW Lu, ZH Feng, ZG Zhang, SB Dun, CP Wen, ... Applied Physics Letters 96 (24), 2010 | 14 | 2010 |
| Forming nanoparticle monolayers at liquid–air interfaces by using miscible liquids D Zhang, J Hu, KM Kennedy, IP Herman Langmuir 32 (33), 8467-8472, 2016 | 13 | 2016 |
| Electronic transport in nanoparticle monolayers sandwiched between graphene electrodes C Lu, D Zhang, A Van Der Zande, P Kim, IP Herman Nanoscale 6 (23), 14158-14162, 2014 | 10 | 2014 |
| Stabilization of Chemical-Vapor-Deposition-Grown WS2 Monolayers at Elevated Temperature with Hexagonal Boron Nitride Encapsulation X Hua, D Zhang, B Kim, D Seo, K Kang, EH Yang, J Hu, X Chen, H Liang, ... ACS applied materials & interfaces 13 (26), 31271-31278, 2021 | 5 | 2021 |
| Activation and detection of buried defects by negative mode E-beam inspection R Buengener, R Fan, J Zhao, D Zhang, CH Wang, J Wang 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2021 | 4 | 2021 |
| Negative mode E-beam inspection of the contact layer OD Patterson, MDG Faruk, D Zhang, G He, B Sheumaker 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2022 | 3 | 2022 |
| Nondestructive Detection of Buried and Latent Defects by Negative Mode E-Beam Inspection R Buengener, J Zhao, S Ding, X Zheng, D Zhang, CH Wang, J Wang IEEE Transactions on Semiconductor Manufacturing 35 (3), 405-411, 2022 | 3 | 2022 |
| CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND METHODS THEREOF D Zhang, X JI, W Ren, X Liu, CW Lin US Patent App. 18/713,108, 2025 | | 2025 |
| System and method for inspection by deflector control in a charged particle system D Zhang, CH Wang, OD Patterson, XH Tang US Patent App. 18/281,272, 2024 | | 2024 |
| Novel Control Method and Applications for Negative Mode E-Beam Inspection OD Patterson, D Zhang, R Buengener, G He, Y Duan, J Chu, ... IEEE Transactions on Semiconductor Manufacturing 36 (3), 345-350, 2023 | | 2023 |
| Energy band-pass filtering for improved high landing energy backscattered charged particle image resolution ZHU Xuechen, F Tazesh, D Zhang, W Ren US Patent App. 17/964,783, 2023 | | 2023 |
| Systems and methods for signal electron detection in an inspection apparatus CY Jen, CH Chen, L Ma, BL Fontaine, D Zhang | | 2022 |
