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Jr-Tai Chen
Jr-Tai Chen
SweGaN AB
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Cited by
Year
Impact of residual carbon on two-dimensional electron gas properties in AlxGa1− xN/GaN heterostructure
JT Chen, U Forsberg, E Janzén
Applied Physics Letters 102 (19), 2013
1132013
A GaN–SiC hybrid material for high-frequency and power electronics
JT Chen, J Bergsten, J Lu, E Janzén, M Thorsell, L Hultman, N Rorsman, ...
Applied Physics Letters 113 (4), 2018
1052018
Dispersive effects in microwave AlGaN/AlN/GaN HEMTs with carbon-doped buffer
S Gustafsson, JT Chen, J Bergsten, U Forsberg, M Thorsell, E Janzén, ...
IEEE Transactions on Electron Devices 62 (7), 2162-2169, 2015
892015
Electron trapping in extended defects in microwave AlGaN/GaN HEMTs with carbon-doped buffers
J Bergsten, M Thorsell, D Adolph, JT Chen, O Kordina, ...
IEEE Transactions on Electron Devices 65 (6), 2446-2453, 2018
792018
Room-temperature mobility above 2200 cm2/V· s of two-dimensional electron gas in a sharp-interface AlGaN/GaN heterostructure
JT Chen, I Persson, D Nilsson, CW Hsu, J Palisaitis, U Forsberg, ...
Applied Physics Letters 106 (25), 2015
732015
Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures
T Hofmann, P Kühne, S Schöche, T Chen Jr, U Forsberg, E Janzén, ...
Applied Physics Letters 101 (19), 2012
652012
Microwave performance of ‘buffer-free’GaN-on-SiC high electron mobility transistors
DY Chen, A Malmros, M Thorsell, H Hjelmgren, O Kordina, JT Chen, ...
IEEE Electron Device Letters 41 (6), 828-831, 2020
632020
Low thermal resistance of a GaN-on-SiC transistor structure with improved structural properties at the interface
JT Chen, JW Pomeroy, N Rorsman, C Xia, C Virojanadara, U Forsberg, ...
Journal of Crystal Growth 428, 54-58, 2015
472015
Transmorphic epitaxial growth of AlN nucleation layers on SiC substrates for high-breakdown thin GaN transistors
J Lu, JT Chen, M Dahlqvist, R Kabouche, F Medjdoub, J Rosen, ...
Applied Physics Letters 115 (22), 2019
462019
A versatile low-resistance ohmic contact process with ohmic recess and low-temperature annealing for GaN HEMTs
YK Lin, J Bergsten, H Leong, A Malmros, JT Chen, DY Chen, O Kordina, ...
Semiconductor Science and Technology 33 (9), 095019, 2018
382018
Properties of two‐dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity‐enhanced THz optical Hall effect
N Armakavicius, JT Chen, T Hofmann, S Knight, P Kühne, D Nilsson, ...
physica status solidi (c) 13 (5‐6), 369-373, 2016
282016
Performance enhancement of microwave GaN HEMTs without an AlN-exclusion layer using an optimized AlGaN/GaN interface growth process
J Bergsten, JT Chen, S Gustafsson, A Malmros, U Forsberg, M Thorsell, ...
IEEE Transactions on electron devices 63 (1), 333-338, 2015
272015
Mg-doping and free-hole properties of hot-wall MOCVD GaN
A Papamichail, A Kakanakova-Georgieva, EÖ Sveinbjörnsson, ...
Journal of Applied Physics 131 (18), 2022
202022
Origin of the anomalous temperature evolution of photoluminescence peak energy in degenerate InN nanocolumns
PC Wei, S Chattopadhyay, FS Lin, CM Hsu, S Jou, JT Chen, PJ Huang, ...
Optics Express 17 (14), 11690-11697, 2009
202009
Epitaxial Growth of InN Films by Molecular-Beam Epitaxy Using Hydrazoic Acid (HN3) as an Efficient Nitrogen Source
JT Chen, CL Hsiao, HC Hsu, CT Wu, CL Yeh, PC Wei, LC Chen, KH Chen
The Journal of Physical Chemistry A 111 (29), 6755-6759, 2007
202007
High voltage and low leakage GaN-on-Sic MISHEMTs on a “buffer-free” heterostructure
B Hult, M Thorsell, JT Chen, N Rorsman
IEEE Electron Device Letters 43 (5), 781-784, 2022
192022
Metalorganic chemical vapor deposition growth of high-mobility AlGaN/AlN/GaN heterostructures on GaN templates and native GaN substrates
JT Chen, CW Hsu, U Forsberg, E Janzén
Journal of Applied Physics 117 (8), 2015
192015
N-polar AlN nucleation layers grown by hot-wall MOCVD on SiC: Effects of substrate orientation on the polarity, surface morphology and crystal quality
H Zhang, PP Paskov, O Kordina, JT Chen, V Darakchieva
Physica B: Condensed Matter 580, 411819, 2020
162020
Enhanced mobility in InAlN/AlN/GaN HEMTs using a GaN interlayer
A Malmros, JT Chen, H Hjelmgren, J Lu, L Hultman, O Kordina, ...
IEEE Transactions on Electron Devices 66 (7), 2910-2915, 2019
152019
High-Resolution Raman and Luminescence Spectroscopy of Isotope-Pure 28Si12C, Natural and 13C – Enriched 4H-SiC
IG Ivanov, M Yazdanfar, B Lundqvist, JT Chen, J Hassan, P Stenberg, ...
Materials Science Forum 778, 471-474, 2014
152014
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Articles 1–20