Water-evaporation-induced electricity with nanostructured carbon materials G Xue, Y Xu, T Ding, J Li, J Yin, W Fei, Y Cao, J Yu, L Yuan, L Gong, ... Nature nanotechnology 12 (4), 317-321, 2017 | 971 | 2017 |
Emerging hydrovoltaic technology Z Zhang, X Li, J Yin, Y Xu, W Fei, M Xue, Q Wang, J Zhou, W Guo Nature nanotechnology 13 (12), 1109-1119, 2018 | 600 | 2018 |
Molecular Beam Epitaxy of Highly Crystalline MoSe2 on Hexagonal Boron Nitride SM Poh, X Zhao, SJR Tan, D Fu, W Fei, L Chu, D Jiadong, W Zhou, ... ACS nano 12 (8), 7562-7570, 2018 | 96 | 2018 |
Ultrathin molybdenum dioxide nanosheets as uniform and reusable surface‐enhanced Raman spectroscopy substrates with high sensitivity H Wu, X Zhou, J Li, X Li, B Li, W Fei, J Zhou, J Yin, W Guo Small 14 (37), 1802276, 2018 | 91 | 2018 |
Low‐voltage Driven Graphene Foam Thermoacoustic Speaker W Fei, J Zhou, W Guo Small 11 (19), 2252-2256, 2015 | 81 | 2015 |
Waving potential at volt level by a pair of graphene sheets W Fei, C Shen, S Zhang, H Chen, L Li, W Guo Nano Energy 60, 656-660, 2019 | 56 | 2019 |
Emerging reconfigurable electronic devices based on two‐dimensional materials: A review W Fei, J Trommer, MC Lemme, T Mikolajick, A Heinzig InfoMat 4 (10), e12355, 2022 | 55 | 2022 |
Heterogeneous graphene oxide membrane for rectified ion transport W Fei, M Xue, H Qiu, W Guo Nanoscale 11 (3), 1313-1318, 2019 | 37 | 2019 |
Layer Identification of Colorful Black Phosphorus. H Chen, W Fei, J Zhou, C Miao, W Guo Small (Weinheim an der Bergstrasse, Germany) 13 (5), 2016 | 34 | 2016 |
Dendritic graphene domains: Growth, morphology and oxidation promotion W Fei, J Yin, X Liu, W Guo Materials Letters 110, 225-228, 2013 | 9 | 2013 |
Graphene Foams: Low‐voltage Driven Graphene Foam Thermoacoustic Speaker (Small 19/2015) W Fei, J Zhou, W Guo Small 11 (19), 2344-2344, 2015 | 3 | 2015 |
Short-Loop Method to Shorten Gate Process Characterization Cycle Time B Li, W Fei, B Lee 2024 Conference of Science and Technology for Integrated Circuits (CSTIC), 1-3, 2024 | | 2024 |
Short-Loop Method to Shorten Gate Process Characterization Cycle Time | | |