| Defect structure and electronic properties of SiOC: H films used for back end of line dielectrics TA Pomorski, BC Bittel, PM Lenahan, E Mays, C Ege, J Bielefeld, ... Journal of Applied Physics 115 (23), 2014 | 70 | 2014 |
| Spin dependent charge pumping in SiC metal-oxide-semiconductor field-effect-transistors BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis Applied Physics Letters 99 (8), 2011 | 53 | 2011 |
| Ultraviolet radiation effects on paramagnetic defects in low-κ dielectrics for ultralarge scale integrated circuit interconnects BC Bittel, PM Lenahan, SW King Applied Physics Letters 97 (6), 2010 | 35 | 2010 |
| Color center formation in vacuum sintered Nd3xY3− 3xAl5O12 transparent ceramics AJ Stevenson, BC Bittel, CG Leh, X Li, EC Dickey, PM Lenahan, ... Applied Physics Letters 98 (5), 2011 | 31 | 2011 |
| Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems TA Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, J Bielefeld, SW King Journal of Applied Physics 114 (7), 2013 | 28 | 2013 |
| Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ... Microelectronics Reliability 63, 201-213, 2016 | 27 | 2016 |
| Trap-assisted conduction in Pt-gated Gd2O3/Si capacitors E Lipp, Z Shahar, BC Bittel, PM Lenahan, D Schwendt, HJ Osten, ... Journal of Applied Physics 109 (7), 2011 | 23 | 2011 |
| Study of Defect Structure and Electrical Transport in Back End of Line Dielectrics and SiC MOSFETs B Bittel | 5 | 2012 |
| EDMR and EPR studies of 4H SiC MOSFETs and capacitors CJ Cochrane, BC Bittel, PM Lenahan, J Fronheiser, K Matocha, AJ Lelis Materials Science Forum 645, 527-530, 2010 | 4 | 2010 |
| Exploring negative bias temperature instability in tri-gate mosfets through electrically detected magnetic resonance KJ Myers, PM Lenahan, BC Bittel, I Meric 2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019 | 3 | 2019 |
| Increasing velocity of wafer level reliability characterization: Novel approaches and limitations B Bittel, S Vadlamani, S Ramey, S Padiyar 2016 IEEE International Integrated Reliability Workshop (IIRW), 87-90, 2016 | 3 | 2016 |
| Spin dependent charge pumping: A new tool for reliability studies BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis 2011 IEEE International Integrated Reliability Workshop Final Report, 142-145, 2011 | 3 | 2011 |
| An Electron Paramagnetic Resonance Study of Defects in Interlayer Dielectrics BC Bittel, T Pomorski, PM Lenahan, S King ECS Transactions 35 (4), 747, 2011 | 3 | 2011 |
| Data Center Silent Data Errors: Implications to Artificial Intelligence Workloads & Mitigations B Bittel, M Shamsa, B Inkley, A Gur, D Lerner, M Adams 2024 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2024 | 2 | 2024 |
| Spin dependent charge pumping: A new tool for MOS interface characterization BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis 2011 International Semiconductor Device Research Symposium (ISDRS), 1-2, 2011 | 2 | 2011 |
| Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI BC Bittel, TA Pomorski, PM Lenahan, S King 2010 IEEE International Integrated Reliability Workshop Final Report, 37-41, 2010 | 2 | 2010 |
| Reliability and performance limiting defects in low-к dielectrics for use as interlayer dielectrics BC Bittel, PM Lenahan, S King 2010 IEEE International Reliability Physics Symposium, 947-950, 2010 | 2 | 2010 |
| Electron paramagnetic resonance studies of interlayer dielectrics BC Bittel, TA Pomorski, PM Lenahan, S King, E Mays 2011 IEEE International Integrated Reliability Workshop Final Report, 50-54, 2011 | 1 | 2011 |
| Band diagram for low-k/Cu interconnects MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ... Microelectronics Reliability, 2016 | | 2016 |
| Novel Charge Pumping method applied to tri-gate MOSFETs for reliability characterization B Bittel, S Novak, S Ramey, S Padiyar, JT Ryan, JP Campbell, ... 2015 IEEE International Integrated Reliability Workshop (IIRW), 69-72, 2015 | | 2015 |