| Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery A Rodriguez, A Tosyali, B Kim, J Choi, JM Lee, BY Coh, MK Jeong IEEE Transactions on Engineering Management 63 (4), 426-437, 2016 | 59 | 2016 |
| Deep autoencoder with clipping fusion regularization on multi-step process signals for virtual metrology J Choi, MK Jeong IEEE Sensors Letters 3 (1), 1-4, 2019 | 21 | 2019 |
| Regularized asymmetric nonnegative matrix factorization for clustering in directed networks A Tosyali, J Kim, J Choi, MK Jeong Pattern Recognition Letters 125, 750-757, 2019 | 17 | 2019 |
| Object-based cluster validation with densities B Tavakkol, J Choi, MK Jeong, SL Albin Pattern Recognition 121, 108223, 2022 | 15 | 2022 |
| Methodology for assessing the contribution of knowledge services during the new product development process to business performance J Choi, B Kim, CH Han, H Hahn, H Park, J Yoo, MK Jeong Expert Systems with Applications 167, 113860, 2021 | 14 | 2021 |
| New node anomaly detection algorithm based on nonnegative matrix factorization for directed citation networks A Tosyali, J Kim, J Choi, Y Kang, MK Jeong Annals of Operations Research 288, 457–474, 2020 | 14 | 2020 |
| Integrated variable importance assessment in multi-stage processes G Gazzola, J Choi, DS Kwak, B Kim, DM Kim, SH Tong, MK Jeong IEEE Transactions on Semiconductor Manufacturing 31 (3), 343-355, 2018 | 14 | 2018 |
| Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms J Choi, B Kim, H Hahn, H Park, Y Jeong, J Yoo, MK Jeong Expert Systems with Applications 84, 37-48, 2017 | 14 | 2017 |
| A novel method for identifying competitors using a financial transaction network J Choi, A Tosyali, B Kim, H Lee, MK Jeong IEEE Transactions on Engineering Management 69 (4), 845-860, 2022 | 13 | 2022 |
| Restricted relevance vector machine for missing data and application to virtual metrology J Choi, Y Son, MK Jeong IEEE Transactions on Automation Science and Engineering 19 (4), 3172-3183, 2022 | 5 | 2022 |
| Efficient visibility algorithm for high-frequency time-series: application to fault diagnosis with graph convolutional network S Lee, J Choi, Y Son Annals of Operations Research 339, 813-833, 2023 | 4 | 2023 |
| A dynamic graph-based approach to ranking firms for identifying key players using inter-firm transactions A Tosyali, J Choi, B Kim, H Lee, MK Jeong Annals of Operations Research 303, 5-27, 2021 | 4 | 2021 |
| Convolutional neural network based multi-input multi-output model for multi-sensor multivariate virtual metrology in semiconductor manufacturing J Choi, M Zhu, J Kang, MK Jeong Annals of Operations Research 339, 185-201, 2024 | 1 | 2024 |
| Competitor identification with memory in a dynamic financial transaction network J Choi, B Kim, H Lee Annals of Operations Research 341, 349-374, 2023 | 1 | 2023 |
| Group-exclusive feature group lasso and applications to automatic sensor selection for virtual metrology in semiconductor manufacturing J Choi, Y Son, J Kang IEEE Transactions on Semiconductor Manufacturing 37 (4), 505-517, 2024 | | 2024 |
| Gaussian kernel with correlated variables for incomplete data J Choi, Y Son, MK Jeong Annals of Operations Research 341, 223-244, 2023 | | 2023 |
| A modified gamma/Gompertz/NBD model for estimating technology lifetime M Choi, SH Yoo, J Lee, J Choi, B Kim Scientometrics 127 (10), 5731-5751, 2022 | | 2022 |
| Sparse machine learning methodology and its applications to semiconductor manufacturing processes J Choi Rutgers The State University of New Jersey, School of Graduate Studies, 2020 | | 2020 |
| Deep learning based virtual metrology and yield prediction in semiconductor manufacturing processes MK Jeong, J Choi, Y Son, J Kang PHM Society Asia-Pacific Conference 1 (1), 2017 | | 2017 |
Myong K (MK) JeongRutgers UniversityVerified email at rutgers.edu
