| Surface analysis: the principal techniques JC Vickerman, IS Gilmore John Wiley & Sons, 2011 | 1487 | 2011 |
| Effect of disorder on Raman scattering of single-layer S Mignuzzi, AJ Pollard, N Bonini, B Brennan, IS Gilmore, MA Pimenta, ... Physical Review B 91 (19), 195411, 2015 | 816 | 2015 |
| The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power MK Passarelli, A Pirkl, R Moellers, D Grinfeld, F Kollmer, R Havelund, ... Nature methods 14 (12), 1175-1183, 2017 | 442 | 2017 |
| XPS: binding energy calibration of electron spectrometers 5—re‐evaluation of the reference energies MP Seah, IS Gilmore, G Beamson Surface and Interface Analysis: An International Journal devoted to the …, 1998 | 373 | 1998 |
| Antiviral surfaces and coatings and their mechanisms of action PD Rakowska, M Tiddia, N Faruqui, C Bankier, Y Pei, AJ Pollard, J Zhang, ... Communications Materials 2 (1), 53, 2021 | 224 | 2021 |
| Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database MP Seah, IS Gilmore, SJ Spencer Journal of Electron Spectroscopy and Related Phenomena 120 (1-3), 93-111, 2001 | 222 | 2001 |
| Chemical intervention in plant sugar signalling increases yield and resilience CA Griffiths, R Sagar, Y Geng, LF Primavesi, MK Patel, MK Passarelli, ... Nature 540 (7634), 574-578, 2016 | 194 | 2016 |
| Metabolic imaging at the single-cell scale: recent advances in mass spectrometry imaging IS Gilmore, S Heiles, CL Pieterse Annual review of analytical chemistry 12 (1), 201-224, 2019 | 187 | 2019 |
| Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard Analytical chemistry 82 (1), 98-105, 2010 | 183 | 2010 |
| Ion detection efficiency in SIMS:: Dependencies on energy, mass and composition for microchannel plates used in mass spectrometry IS Gilmore, MP Seah International Journal of Mass Spectrometry 202 (1-3), 217-229, 2000 | 173 | 2000 |
| Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ... Analytical chemistry 84 (18), 7865-7873, 2012 | 166 | 2012 |
| An accurate semi‐empirical equation for sputtering yields I: for argon ions MP Seah, CA Clifford, FM Green, IS Gilmore Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 166 | 2005 |
| Single-cell analysis: visualizing pharmaceutical and metabolite uptake in cells with label-free 3D mass spectrometry imaging MK Passarelli, CF Newman, PS Marshall, A West, IS Gilmore, J Bunch, ... Analytical chemistry 87 (13), 6696-6702, 2015 | 164 | 2015 |
| Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS AG Shard, FM Green, PJ Brewer, MP Seah, IS Gilmore The Journal of Physical Chemistry B 112 (9), 2596-2605, 2008 | 144 | 2008 |
| Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials AG Shard, PJ Brewer, FM Green, IS Gilmore Surface and Interface Analysis: An International Journal devoted to the …, 2007 | 139 | 2007 |
| Ambient mass spectrometry: advances and applications in forensics FM Green, TL Salter, P Stokes, IS Gilmore, G O'Connor Surface and Interface Analysis: An International Journal devoted to the …, 2010 | 123 | 2010 |
| The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency and spatial resolution FM Green, TL Salter, IS Gilmore, P Stokes, G O'connor Analyst 135 (4), 731-737, 2010 | 123 | 2010 |
| Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, β and attenuation lengths MP Seah, IS Gilmore Surface and Interface Analysis: An International Journal devoted to the …, 2001 | 117 | 2001 |
| Quantification and methodology issues in multivariate analysis of ToF‐SIMS data for mixed organic systems JLS Lee, IS Gilmore, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2008 | 106 | 2008 |
| Static SIMS: towards unfragmented mass spectra—the G-SIMS procedure IS Gilmore, MP Seah Applied surface science 161 (3-4), 465-480, 2000 | 106 | 2000 |
