| Processing technologies for advanced Ge devices R Loo, AY Hikavyy, L Witters, A Schulze, H Arimura, D Cott, J Mitard, ... ECS Journal of Solid State Science and Technology 6 (1), P14, 2016 | 43 | 2016 |
| Combinatorial molecular beam epitaxy synthesis and characterization of magnetic alloys F Tsui, PA Ryan Applied surface science 189 (3-4), 333-338, 2002 | 31 | 2002 |
| Experimental evidence for electron channeling in Fe/Au (100) superlattices DT Dekadjevi, PA Ryan, BJ Hickey, BD Fulthorpe, BK Tanner Physical review letters 86 (25), 5787, 2001 | 30 | 2001 |
| Fast measurement of X-ray diffraction from tilted layers J Wall, D Jacques, B Yokhin, A Krokhmal, P Ryan, R Bytheway, D Berman, ... US Patent 8,437,450, 2013 | 25 | 2013 |
| Epitaxial thin films of hexagonal on (001) MK Lee, CB Eom, J Lettieri, IW Scrymgeour, DG Schlom, W Tian, XQ Pan, ... Applied Physics Letters 78 (3), 329-331, 2001 | 20 | 2001 |
| X-ray critical dimension metrology solution for high aspect ratio semiconductor structures M Wormington, A Ginsburg, I Reichental, A Dikopoltsev, A Krokhmal, ... Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 17 | 2021 |
| Strain and compositional analysis of (Si) Ge fin structures using high resolution X‐Ray diffraction A Schulze, R Loo, L Witters, H Mertens, A Gawlik, N Horiguchi, N Collaert, ... physica status solidi c 14 (12), 1700156, 2017 | 13 | 2017 |
| Observation and understanding of anisotropic strain relaxation in selectively grown SiGe fin structures A Schulze, R Loo, P Ryan, M Wormington, P Favia, L Witters, N Collaert, ... Nanotechnology 28 (14), 145703, 2017 | 13 | 2017 |
| Self-organization of carbide superlattice and nucleation of carbon nanotubes F Tsui, PA Ryan Journal of nanoscience and nanotechnology 3 (6), 529-534, 2003 | 13 | 2003 |
| Direct measurement of twist mosaic in epitaxial GaN TA Lafford, PA Ryan, DE Joyce, MS Goorsky, BK Tanner physica status solidi (a) 195 (1), 265-270, 2003 | 12 | 2003 |
| Magnetic multilayers of Fe/Au: role of the electron mean free path MA Howson, BJ Hickey, J Garfield, J Xu, PA Ryan, D Greig, A Yelon, ... Journal of Physics: Condensed Matter 11 (30), 5717, 1999 | 12 | 1999 |
| X-ray beam conditioning PA Ryan, JL Wall, J Spence US Patent 9,269,468, 2016 | 11 | 2016 |
| Temperature dependence of magnetic anisotropy of La0. 8Ca0. 2MnO3 epitaxial thin films MC Smoak, PA Ryan, F Tsui, TK Nath, RA Rao, D Lavric, CB Eom Journal of Applied Physics 87 (9), 6764-6766, 2000 | 10 | 2000 |
| Selective-Area Metal Organic Vapor-Phase Epitaxy of InGaAs/InP Heterostrucures On Si For Advanced CMOS Devices C Merckling, N Waldron, S Jiang, W Guo, P Ryan, N Collaert, M Caymax, ... ECS Transactions 61 (2), 107, 2014 | 9 | 2014 |
| Using multiple sources/detectors for high-throughput X-ray topography measurement PA Ryan, JL Wall, M Wormington US Patent 9,726,624, 2017 | 7 | 2017 |
| Self-organization of a carbide superlattice during deposition of carbon on Mo F Tsui, PA Ryan Physical review letters 89 (1), 015503, 2002 | 7 | 2002 |
| The relation of structure to giant magnetoresistance in Co/Cu multilayers TPA Hase, I Pape, BK Tanner, H Laidler, P Ryan, BJ Hickey Journal of magnetism and magnetic materials 177, 1164-1165, 1998 | 7 | 1998 |
| Crystalline damage in silicon wafers and'rare event'failure introduced by low-energy mechanical impact F Atrash, I Meshi, A Krokhmal, P Ryan, M Wormington, D Sherman Materials Science in Semiconductor Processing 63, 40-44, 2017 | 6 | 2017 |
| Detection of wafer-edge defects M Wormington, P Ryan, JL Wall US Patent 8,781,070, 2014 | 6 | 2014 |
| A Novel X‐ray Diffraction and Reflectivity Tool for Front‐End of Line Metrology M Wormington, B Yokhin, D Berman, A Krokhmal, I Mazor, P Ryan, J Wall, ... AIP Conference Proceedings 1395 (1), 198-203, 2011 | 5 | 2011 |
