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Youngwoo KwonSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
Qian ZhongLassenPeakVerified email at lassenpeak.com
Zhiyu ChenSamsung SemiconductorVerified email at samsung.com
Navneet SharmaUniversity of Texas at DallasVerified email at utdallas.edu
PRANITH REDDY BYREDDYThe University of Texas at DallasVerified email at utdallas.edu
Youngmin KimPrincipal Engineer, Samsung ElectronicsVerified email at samsung.com
John F. O'HaraOklahoma State UniversityVerified email at okstate.edu
Zeshan AhmadTexas Analog Center of Excellence, UT-DallasVerified email at utdallas.edu
Jing ZhangAnokiwave Inc.Verified email at anokiwave.com
Ickhyun SongAssistant Professor at Hanyang UniversityVerified email at hanyang.ac.kr
Shenggang DongSamsungVerified email at samsung.com
Ivan MedvedevWright State UniversityVerified email at wright.edu
Insoo KimAssistant Professor of Medicine, University of Connecticut Health CenterVerified email at uchc.edu
James P McMillanThe Ohio State UniversityVerified email at osu.edu
Christopher NeeseThe Ohio State UniversityVerified email at physics.osu.edu
Yong-Kweon KimSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
Youngrak ParkGeorgia Institute of TechnologyVerified email at gatech.edu
Dong-il "Dan" ChoSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
David John LaryUniversity of Texas at Dallas, Professor of Physics, Hanson Center for Space SciencesVerified email at utdallas.edu
Gwangrok JungBroadcom Inc.Verified email at broadcom.com