| Making predictive analog/RF alternate test strategy independent of training set size H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE International Test Conference, 1-9, 2012 | 53 | 2012 |
| Smart selection of indirect parameters for DC-based alternate RF IC testing H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ... 2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012 | 46 | 2012 |
| Multilevel operation in oxide based resistive RAM with SET voltage modulation H Aziza, H Ayari, S Onkaraiah, M Moreau, JM Portal, M Bocquet 2016 International Conference on Design and Technology of Integrated Systems …, 2016 | 11 | 2016 |
| On the use of redundancy to reduce prediction error in alternate analog/RF test H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test …, 2012 | 11 | 2012 |
| Optimized Design of a Digital IQ Demodulator Suitable for Adaptive Predistortion of 3rd Generation Base Station PAs H Ayari, R C., A Ghazel, S Boumaiza, F Ghannouchi Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International …, 2006 | 7 | 2006 |
| Programmable-resistance non-volatile memory T Benoist, H Ayari, B Giraud, A Makosiej, Y Maneglia, S Onkaraiah, ... US Patent 9,508,434, 2016 | 4 | 2016 |
| Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability H Aziza, H Ayari, S Onkaraiah, JM Portal, M Moreau, M Bocquet Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 …, 2014 | 4 | 2014 |
| New implementions of predictive alternate analog/RF test with augmented model redundancy H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, M Renovell 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014 | 3 | 2014 |
| Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements H Ayari, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell Microelectronics Journal 45 (3), 336-344, 2014 | 2 | 2014 |
| Psychosocial factors burden in workers with acute cerebro-or cardiovascular events: A multidisciplinary prospective pilot study Y Bejot, E Salès-Wuillemin, J Chappé, M Giroud, C Aboa-Eboulé, ... Archives of Cardiovascular Diseases Supplements 10 (1), 128, 2018 | 1 | 2018 |
| Psychosocial and behavioral characteristics of still smokers at 6 months after acute cerebro or cardiovascular events: preliminary findings from INEV@ L, a prospective pilot study M Zeller, E Sales-Wuillemin, S Guinchard, J Chappe, F Chague, H Ayari, ... European Heart Journal 42 (Supplement_1), ehab724. 2595, 2021 | | 2021 |
| Serum Tenascin-C is independently associated with increased major adverse cardiovascular events and death in patients with type II diabetes M Zeller, E Sales-Wuillemin, S Guinchard, J Chappé, F Chagué, H Ayari, ... Archives of Cardiovascular Diseases Supplements 12 (1), 156, 2020 | | 2020 |
| Psychosocial and behavioral characteristics of still smokers at 6 months after acute cerebro or cardiovascular events: Findings from INEV@ L, a prospective pilot study M Zeller, E Salès-Wuillemin, S Guinchard, J Chappé, F Chagué, H Ayari, ... Archives of Cardiovascular Diseases Supplements 12 (1), 156, 2020 | | 2020 |
| Stress at work burden as new risk factor in patients with acute cerebro-or cardiovascular events: Preliminary findings from INEV@ L, a prospective pilot study M Zeller, E Salès-Wuillemin, J Chappé, S Guinchard, H Ayari, M Maza, ... Archives of Cardiovascular Diseases Supplements 11 (1), 123, 2019 | | 2019 |
| Investigations on alternate analog/RF test with model redundancy H Ayari, F Azaïs, S Bernard, V Kerzérho, S Larguech, M Comte, ... STEM Workshop, 2014 | | 2014 |
| Test indirect des circuits analogique et RF: contribution pour une meilleure précision et robustesse H Ayari Montpellier 2, 2013 | | 2013 |
| Indirect Analog/RF IC testing: Accuracy & Robustness improvements H Ayari Université Montpellier II-Sciences et Techniques du Languedoc, 2013 | | 2013 |
| Implementing model redundancy in predictive alternate test to improve test confidence H Ayari, F Azais, S Bernard, M Comte, V Kcrzerho, O Potin, M Renovell 2013 18th IEEE European Test Symposium (ETS), 1-1, 2013 | | 2013 |
Serge BernardLIRMM, CNRS/Université de montpellierVerified email at lirmm.fr