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Co-authors
Azad NaeemiProfessor of Electrical and Computer Engineering, Georgia Institute of TechnologyVerified email at gatech.edu
Shaloo RakhejaAssociate Professor, Electrical and Computer Engineering, University of Illinois at Urbana-ChampaignVerified email at illinois.edu
Li ZhengGeorgia institute of technologyVerified email at gatech.edu
Erdal UzunlarAssistant Professor at İzmir Institute of Technology, İzmir, TurkeyVerified email at iyte.edu.tr
Sou-Chi ChangComponents Research at IntelVerified email at intel.com
Uygar E. AvciComponents Research, Intel Corp.Verified email at intel.com
Hanju OhAppleVerified email at apple.com
Ahmet CeyhanIntel CorporationVerified email at intel.com
Christopher M. NeumannIntelVerified email at intel.com
Xuchen ZhangGeorgia Institute of TechnologyVerified email at gatech.edu
Nafees A. KabirComponents Research, Intel Corporation, SUNY Buffalo, Arizona State University, IIT-KharagpurVerified email at intel.com
Fatih HamzaogluFellow, Intel CorporationVerified email at intel.com
Chenyun PanAssistant Professor of EE, University of Texas at ArlingtonVerified email at uta.edu
Rouhollah Mousavi IraeiQualCommVerified email at qti.qualcomm.com
Ramy NashedIntelVerified email at chemistry.gatech.edu
Romeil SandhuCS, Sigmatech