Alessandro Di Bucchianico

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thomas merelleProduct ManagerVerified email at smartphotonics.nl
Henry P WynnLondon School of Economics and Alan Turing Institute, LondonVerified email at lse.ac.uk
Marko BoonAssistant Professor, Eindhoven University of TechnologyVerified email at tue.nl
Kees van HeeEmeritus Professor of Computer Science, Eindhoven University of TechnologyVerified email at tue.nl
E.R. van den HeuvelEindhoven University of Technology, Boston University, University Medical Center GroningenVerified email at tue.nl
Yingjun DengUniversity of WaterlooVerified email at uwaterloo.ca
Mykola PechenizkiyEindhoven University of TechnologyVerified email at tue.nl
Andras PoppeBME Elektronikus Eszközök TanszékeVerified email at eet.bme.hu
Michel BerkelaarDelft University of TechnologyVerified email at berkelaar.org
Jose Pineda de GyvezNXP Semiconductors and Eindhoven University of TechnologyVerified email at tue.nl
Nick van der MeijsDelft University of TechnologyVerified email at tudelft.nl
Stella KapodistriaEindhoven University of TechnologyVerified email at tue.nl
Jan Friso GrooteFull Professor (Hoogleraar), Eindhoven University of TechnologyVerified email at tue.nl
Mark PeletierTU/eVerified email at tue.nl
Peter M van de VenUMC Utrecht, Dept. Data Science & BiostatisticsVerified email at umcutrecht.nl
Frank van der MeulenVrije Universiteit AmsterdamVerified email at vu.nl
Eva RiccomagnoDipartimento di Matematica, Università di GenovaVerified email at dima.unige.it
Maria CraciunTiberiu Popoviciu Institute of Numerical Analysis, Romanian AcademyVerified email at ictp.acad.ro
Aarnout Brombacherprofessor of Industrial Design, Eindhoven University of TechnologyVerified email at tue.nl
Laura IapichinoAssistant Professor at Technical University of EindhovenVerified email at tue.nl

Alessandro Di Bucchianico

Associate Professor of Statistics, Eindhoven University of Technology

Verified email at tue.nl - Homepage

software reliability industrial statistics statistical process control statistical education statistical computing


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Coefficient of Determination (R²) A Di Bucchianico Encyclopedia of statistics in quality and reliability, 2008	276	2008
Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield TS Doorn, EJW ter Maten, JA Croon, A Di Bucchianico, O Wittich ESSCIRC 2008-34th European Solid-State Circuits Conference, 230-233, 2008	116	2008
Umbral calculus A Di Bucchianico, D Loeb The Electronic Journal of Combinatorics, DS3: Apr 10-2000, 2012	112*	2012
Smallest nonparametric tolerance regions A Di Bucchianico, JHJ Einmahl, NA Mushkudiani Annals of statistics, 1320-1343, 2001	56	2001
Probabilistic and analytical aspects of the umbral calculus DI BUCCHIANICO CW/TRACT 119, 1996	55	1996
Controlling the accuracy and uncertainty trade-off in RUL prediction with a surrogate Wiener propagation model Y Deng, A Di Bucchianico, M Pechenizkiy Reliability Engineering & System Safety 196, 106727, 2020	51	2020
Combinatorics, computer algebra and the Wilcoxon-Mann-Whitney test A Di Bucchianico Journal of statistical planning and inference 79 (2), 349-364, 1999	43	1999
Fast computation of the exact null distribution of Spearman's ρ and Page's L statistic for samples with and without ties MA Van de Wiel, A Di Bucchianico Journal of statistical planning and inference 92 (1-2), 133-145, 2001	42	2001
Symbolic computation and exact distributions of nonparametric test statistics MA Van de Wiel, A Di Bucchianico, P Van der Laan Journal of the Royal Statistical Society Series D: The Statistician 48 (4 …, 1999	35	1999
Monitoring infrequent failures of high‐volume production processes A Di Bucchianico, GD Mooiweer, EJG Moonen Quality and Reliability Engineering International 21 (5), 521-528, 2005	33	2005
Operator expansion in the derivative and multiplication by x AD Bucchianico, DE Loeb Integral Transforms and Special Functions 4 (1-2), 49-68, 1996	32	1996
Stochastic analysis of deep-submicrometer CMOS process for reliable circuits designs A Zjajo, Q Tang, M Berkelaar, JP de Gyvez, A Di Bucchianico, ... IEEE Transactions on Circuits and Systems I: Regular Papers 58 (1), 164-175, 2010	31	2010
Sequences of binomial type with persistent roots A Di Bucchianico, DE Loeb Journal of mathematical analysis and applications 199 (1), 39-58, 1996	29	1996
Quantified insights into LED variability R Bornoff, T Mérelle, J Sari, A Di Bucchianico, G Farkas 2018 24rd International Workshop on Thermal Investigations of ICs and …, 2018	26	2018
Umbral calculus in Hilbert space A Di Bucchianico, DE Loeb, GC Rota Mathematical essays in honor of Gian-Carlo Rota, 213-238, 1998	22	1998
PrimaVera: Synergising predictive maintenance B Ton, R Basten, J Bolte, J Braaksma, A Di Bucchianico, ... Applied Sciences 10 (23), 8348, 2020	18	2020
Inter laboratory comparison of LED measurements aimed as input for multi-domain compact model development within a European-wide R&D project A Poppe, G Farkas, F Szabó, J Joly, J Thomé, J Yu, K Bosschaartl, ... Proceedings of the Conference on “Smarter Lighting for Better Life” at the …, 2017	17	2017
A yield centric statistical design method for optimization of the SRAM active column TS Doorn, JA Croon, EJW ter Maten, A Di Bucchianico 2009 Proceedings of ESSCIRC, 352-355, 2009	17	2009
Software reliability for agile testing WD Van Driel, JW Bikker, M Tijink, A Di Bucchianico Mathematics 8 (5), 791, 2020	16	2020
Performance measures of discrete and continuous time‐between‐events control charts C Rizzo, ST Chin, E van den Heuvel, A Di Bucchianico Quality and Reliability Engineering International 36 (8), 2754-2768, 2020	15	2020

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