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Gung-Chian Yin
Gung-Chian Yin
Verified email at nsrrc.org.tw
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Year
30nm resolution x-ray imaging at 8keV using third order diffraction of a zone plate lens objective in a transmission microscope
GC Yin, YF Song, MT Tang, FR Chen, KS Liang, FW Duewer, M Feser, ...
Applied Physics Letters 89 (22), 2006
1422006
Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement
YT Chen, TN Lo, YS Chu, J Yi, CJ Liu, JY Wang, CL Wang, CW Chiu, ...
Nanotechnology 19 (39), 395302, 2008
1282008
Energy-tunable transmission X-ray microscope for differential contrast imaging with near 60nm resolution tomography
GC Yin, MT Tang, YF Song, FR Chen, KS Liang, FW Duewer, W Yun, ...
Applied Physics Letters 88 (24), 2006
1252006
Performance of the SRRC scanning photoelectron microscope
IH Hong, TH Lee, GC Yin, DH Wei, JM Juang, TE Dann, R Klauser, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
572001
X-ray beamlines for structural studies at the NSRRC superconducting wavelength shifter
YF Song, CH Chang, CY Liu, SH Chang, US Jeng, YH Lai, DG Liu, ...
Synchrotron Radiation 14 (4), 320-325, 2007
542007
Nanoimaging granule dynamics and subcellular structures in activated mast cells using soft X-ray tomography
HY Chen, DML Chiang, ZJ Lin, CC Hsieh, GC Yin, IC Weng, P Guttmann, ...
Scientific reports 6 (1), 34879, 2016
432016
Fabrication of high-aspect-ratio Fresnel zone plates by e-beam lithography and electroplating
YT Chen, TN Lo, CW Chiu, JY Wang, CL Wang, CJ Liu, SR Wu, ST Jeng, ...
Synchrotron Radiation 15 (2), 170-175, 2008
402008
Zone-plate-based scanning photoelectron microscopy at SRRC: performance and applications
R Klauser, IH Hong, TH Lee, GC Yin, DH Wei, KL Tsang, TJ Chuang, ...
Surface Review and Letters 9 (01), 213-222, 2002
322002
Fast projection matching for X-ray tomography
CC Wang, CC Chiang, B Liang, GC Yin, YT Weng, LC Wang
Scientific reports 7 (1), 3691, 2017
302017
Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline
BH Lin, YH Wu, XY Li, HC Hsu, YC Chiu, CY Lee, BY Chen, GC Yin, ...
Synchrotron Radiation 27 (1), 217-221, 2020
242020
Imaging cells and sub-cellular structures with ultrahigh resolution full-field X-ray microscopy
CC Chien, PY Tseng, HH Chen, TE Hua, ST Chen, YY Chen, WH Leng, ...
Biotechnology advances 31 (3), 375-386, 2013
242013
Probing the exciton-phonon coupling strengths of O-polar and Zn-polar ZnO wafer using hard X-ray excited optical luminescence
BH Lin, HY Chen, SC Tseng, JX Wu, BY Chen, CY Lee, GC Yin, ...
Applied Physics Letters 109 (19), 2016
212016
Peculiar near-band-edge emission of polarization-dependent XEOL from a non-polar a-plane ZnO wafer
BH Lin, YC Wu, HY Chen, SC Tseng, JX Wu, XY Li, BY Chen, CY Lee, ...
Optics express 26 (3), 2731-2739, 2018
172018
Quantitative phase retrieval in transmission hard x-ray microscope
GC Yin, FR Chen, Y Hwu, HPD Shieh, KS Liang
Applied physics letters 90 (18), 2007
132007
Photoelectron microscopy projects at srrc
DH Wei, YJ Hsu, R Klauser, IH Hong, GC Yin, TJ Chuang
Surface Review and Letters 10 (04), 617-624, 2003
112003
X-ray nanoprobe project at Taiwan Photon Source
GC Yin, SH Chang, BY Chen, HY Chen, BH Lin, SC Tseng, CY Lee, ...
AIP Conference Proceedings 1741 (1), 2016
102016
Investigation of cavity enhanced XEOL of a single ZnO microrod by using multifunctional hard X-ray nanoprobe
BH Lin, XY Li, DJ Lin, BL Jian, HC Hsu, HY Chen, SC Tseng, CY Lee, ...
Scientific reports 9 (1), 207, 2019
92019
Information-tagged Data-acquisition System for On-the-fly Scanning
CY Lee, GC Yin, BY Chen, HY Chen, BH Lin, SC Tseng, SH Chang, XY Li, ...
Microscopy and Microanalysis 24 (S2), 104-105, 2018
92018
Hard X-ray microscopy with sub-30 nm spatial resolution at NSRRC
MT Tang, GC Yin, YF Song, JH Chen, KL Tsang, KS Liang, FR Chen, ...
Proceeding of the 8th International Conference of X-Ray Microscopy, 15-17, 2006
92006
A coherence approach to phase-contrast microscopy II: Experiment
BD Arhatari, AG Peele, K Hannah, P Kappen, KA Nugent, GJ Williams, ...
Ultramicroscopy 109 (3), 280-286, 2009
82009
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