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Ramazan LÖK
Ramazan LÖK
Öğretim Görevlisi, Abant İzzet Baysal Üniversitesi
Verified email at ibu.edu.tr
Title
Cited by
Cited by
Year
Frequency dependent electrical characteristics of BiFeO3 MOS capacitors
S Kaya, R Lok, A Aktag, J Seidel, E Yilmaz
Journal of Alloys and Compounds 583, 476-480, 2014
622014
Structural characterization and electrical properties of Nd2O3 by sol–gel method
R Lok, E Budak, E Yilmaz
Journal of Materials Science: Materials in Electronics 31 (4), 3111-3118, 2020
312020
A detailed study on the frequency-dependent electrical characteristics of Al/HfSiO4/p-Si MOS capacitors
R Lok, S Kaya, H Karacali, E Yilmaz
Journal of Materials Science: Materials in Electronics 27, 13154-13160, 2016
292016
The Co-60 gamma-ray irradiation effects on the Al/HfSiO4/p-Si/Al MOS capacitors
R Lok, S Kaya, H Karacali, E Yilmaz
Radiation Physics and Chemistry 141, 155-159, 2017
232017
Co-60 gamma irradiation influences on physical, chemical and electrical characteristics of HfO2/Si thin films
S Kaya, I Yıldız, R Lok, E Yılmaz
Radiation Physics and Chemistry 150, 64-70, 2018
222018
Impact of interfacial layer using ultra-thin SiO2 on electrical and structural characteristics of Gd2O3 MOS capacitor
A Kahraman, U Gurer, R Lok, S Kaya, E Yilmaz
Journal of Materials Science: Materials in Electronics 29, 17473-17482, 2018
162018
Thermal phase separation of ZrSiO4 thin films and frequency- dependent electrical characteristics of the Al/ZrSiO4/p-Si/Al MOS capacitors
R Lok, Ş Kaya, E Yılmaz
Semiconductor Science and Technology, 2018
122018
Fabrication and characterization of resistance temperature detector by smart mask design
R Lok, H Karacali, A Varol, U Camli, E Yilmaz
The International Journal of Advanced Manufacturing Technology 122 (1), 147-158, 2022
102022
Effect of high-radiation-dose-induced structural modifications of HfSiO4/n-Si on electrical characteristics
A Kahraman, A Mutale, R Lok, E Yilmaz
Radiation Physics and Chemistry 196, 110138, 2022
62022
Radiation response of zirconium silicate P-MOS capacitor
R Lok, E Budak, E Yilmaz
Microelectronics Reliability 109, 113663, 2020
62020
Investigation of Interface States, Series Resistance and Barrier Height Variation with Frequency in Al/WO3/p-Si (MOS) Capacitors
R Lök
Journal of the Institute of Science and Technology 14 (4), 1538-1549, 2024
12024
Gamma radiation-induced modifications in structural, optical, and electrical characteristics of p-NiO/n-Si heterojunction diodes
R Lok, MU Doğan, S Kaya, U Soykan, C Terzioğlu
Radiation Physics and Chemistry 229, 112519, 2025
2025
Effect of high-radiation-dose-induced structural modifications of HfSiO4/n-Si on electrical characteristics
A Mutale, R Lok, E Yılmaz
Pergamon-elsevier Science Ltd, 2022
2022
Impact of interfacial layer using ultra-thin SiO₂ on electrical and structural characteristics of Gd₂O₃ MOS capacitor
U Gürer, R Lok, Ş Kaya, E Yılmaz
Springer, 2018
2018
C apacitors, Radiation Physics and Chemistry
R LOK, S KAYA, H KARACALI, E YILMAZ
2017
Lowering Synthesis Temperature of hBN by Improvement of Precursor
E Budak, R Lok, E Yilmaz
Structural Properties And Radiation Response Of Neodymium Oxide
R Lok, E Budak, E Yilmaz
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