‪Jacob deforce‬ - ‪Academic Search‬

Get my own profile

Cited by

	All	Since 2020
Citations	2	2
h-index	1	1
i10-index	0	0

Co-authors

Bappaditya Dey, PhDSenior R&D Engineer, imecVerified email at imec.be
Ying-Lin ChenimecVerified email at imec.be
Vic De RidderKU LeuvenVerified email at ugent.be

Jacob deforce

Jacob deforce

Student Comp. Engin., UGent

Verified email at ugent.be

deep learning computer vision


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Decentralized data, centralized insights: a federated machine learning framework for SEM based defect classification and detection in semiconductor manufacturing B Dey, J Deforce, V Blanco, S Halder, P Leray Metrology, Inspection, and Process Control XXXVIII 12955, 129553V, 2024	1	2024
Towards improved semiconductor defect inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS YL Chen, J Deforce, V De Ridder, B Dey, V Blanco, S Halder, P Leray Metrology, Inspection, and Process Control XXXVIII 12955, 197-215, 2024	1	2024
Fed-SEMI: A Federated Machine Learning Framework for Nano-Scale Defect Classification and Detection in Semiconductor Manufacturing with Decentralized and Private Data B Dey, J Deforce, V Blanco, S Halder, P Leray 2024 International Symposium ELMAR, 133-140, 2024		2024

The system can't perform the operation now. Try again later.

Articles 1–3