Miniaturized SIW bandpass filter based on TSV technology for THz applications F Wang, VF Pavlidis, N Yu IEEE Transactions on Terahertz Science and Technology 10 (4), 423-426, 2020 | 54 | 2020 |
An effective approach of reducing the keep-out-zone induced by coaxial through-silicon-via F Wang, Z Zhu, Y Yang, X Yin, X Liu, R Ding IEEE Transactions on Electron Devices 61 (8), 2928-2934, 2014 | 50 | 2014 |
An ultracompact butterworth low-pass filter based on coaxial through-silicon vias F Wang, N Yu IEEE transactions on very large scale integration (VLSI) systems 25 (3 …, 2016 | 32 | 2016 |
Simple and accurate inductance model of 3D inductor based on TSV F Wang, N Yu Electronics Letters 52 (21), 1815-1816, 2016 | 23 | 2016 |
A miniatured passive low-pass filter with ultrawide stopband based on 3-D integration technology X Yin, F Wang, Q Lu, X Liu, Y Liu, Y Yang IEEE Microwave and Wireless Components Letters 32 (1), 29-32, 2021 | 20 | 2021 |
Capacitance characterization of tapered through-silicon-via considering MOS effect F Wang, Z Zhu, Y Yang, X Liu, R Ding Microelectronics Journal 45 (2), 205-210, 2014 | 19 | 2014 |
Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV) F Wang, Z Zhu, Y Yang, X Liu, R Ding IEICE Electronics Express 10 (20), 20130666-20130666, 2013 | 16 | 2013 |
A Miniaturized Wideband Interdigital Bandpass Filter With High Out-Band Suppression Based on TSV Technology for W-Band Application F Wang, K Zhang, X Yin, N Yu, Y Yang IEEE Transactions on Very Large Scale Integration (VLSI) Systems 30 (7), 989-992, 2022 | 13 | 2022 |
A novel guard method of through-silicon-via (TSV) F Wang, J Huang, N Yu IEICE Electronics Express 15 (11), 20180421-20180421, 2018 | 13 | 2018 |
An effective approach of improving electrical and thermo-mechanical reliabilities of through-silicon vias F Wang, N Yu IEEE Transactions on Device and Materials Reliability 17 (1), 106-112, 2016 | 13 | 2016 |
A Miniaturized Wideband SIR Interdigital Bandpass Filter With High Performance Based on TSV Technology for W-Band Application F Wang, K Zhang, X Yin, N Yu, Y Yang IEEE Transactions on Components, Packaging and Manufacturing Technology 13 …, 2023 | 12 | 2023 |
Study on thermal stress and keep-out zone induced by Cu and SiO2 filled coaxial-annular through-silicon via F Wang, N Yu IEICE Electronics Express 12 (22), 20150844-20150844, 2015 | 12 | 2015 |
A thermal model for the top layer of 3D integrated circuits considering through silicon vias F Wang, Z Zhu, Y Yang, N Wang 2011 9th IEEE International Conference on ASIC, 618-620, 2011 | 12 | 2011 |
A transformer with high coupling coefficient and small area based on TSV F Wang, R Ren, X Yin, N Yu, Y Yang Integration 81, 211-220, 2021 | 11 | 2021 |
Design of compact LC lowpass filters based on coaxial through-silicon vias array X Yin, F Wang, VF Pavlidis, X Liu, Q Lu, T Zhang, Y Liu Microelectronics Journal 116, 105217, 2021 | 11 | 2021 |
Thermo-mechanical performance of Cu and SiO2 filled coaxial through-silicon-via (TSV) F Wang, Z Zhu, Y Yang, X Liu, R Ding IEICE Electronics Express 10 (24), 20130894-20130894, 2013 | 11 | 2013 |
A compact sixth-order common-mode noise suppression filter based on 3-D integration technology F Wang, C Hou, X Yin, N Yu, Y Yang IEEE Transactions on Components, Packaging and Manufacturing Technology 13 …, 2023 | 10 | 2023 |
Optimization of 3D IC Routing Based on Thermal Equalization Analysis L Liu, F Wang, X Yin, C Sun, X Li, Y Li, N Yu, Y Yang IEEE Transactions on Device and Materials Reliability, 2024 | 9 | 2024 |
Characteristics of coaxial-annular through-silicon-via in microwave field F Wang, G Wang, N Yu 2016 17th International Conference on Electronic Packaging Technology (ICEPT …, 2016 | 9 | 2016 |
Impedance matching for the reduction of signal reflection in high speed multilevel three-dimensional integrated chips X Liu, Z Zhu, Y Yang, F Wang, R Ding Journal of Semiconductors 35 (1), 015008, 2014 | 9 | 2014 |