| Optimal multiple importance sampling I Kondapaneni, P Vévoda, P Grittmann, T Skřivan, P Slusallek, J Křivánek ACM Transactions on Graphics (TOG) 38 (4), 1-14, 2019 | 58 | 2019 |
| Bayesian online regression for adaptive direct illumination sampling P Vévoda, I Kondapaneni, J Křivánek ACM Transactions on Graphics (TOG) 37 (4), 1-12, 2018 | 46 | 2018 |
| Advances in Monte Carlo rendering: the legacy of Jaroslav Křivánek. A Keller, P Grittmann, J Vorba, I Georgiev, M Sik, E d'Eon, P Gautron, ... SIGGRAPH Courses, 3:1-3:366, 2020 | 8 | 2020 |
| Quantum yield bias in materials with lower absorptance B van Dam, B Bruhn, I Kondapaneni, G Dohnal, A Wilkie, J Křivánek, ... Physical Review Applied 12 (2), 024022, 2019 | 7 | 2019 |
| Visualization techniques utilizing the sensitivity analysis of models I Kondapaneni, P Kordík, P Slavík 2007 Winter Simulation Conference, 730-737, 2007 | 6 | 2007 |
| On a critical artifact in the quantum yield methodology B van Dam, B Bruhn, I Kondapaneni, G Dohnal, A Wilkie, J Křivánek, ... arXiv preprint arXiv:1808.00779, 2018 | 1 | 2018 |
| Optimal Multiple Importance Sampling: Supplemental Document IVO KONDAPANENI, P VÉVODA, P GRITTMANN, T SKŘIVAN, ... | | |
