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Fang Yuan
Fang Yuan
Google LLC, Stanford University, Tsinghua University, Exponent Inc.
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Bridging biological and artificial neural networks with emerging neuromorphic devices: fundamentals, progress, and challenges
J Tang, F Yuan, X Shen, Z Wang, M Rao, Y He, Y Sun, X Li, W Zhang, Y Li, ...
Advanced Materials 31 (49), 1902761, 2019
6672019
Electronic synapses made of layered two-dimensional materials
Y Shi, X Liang, B Yuan, V Chen, H Li, F Hui, Z Yu, F Yuan, E Pop, ...
Nature Electronics 1 (8), 458-465, 2018
6152018
Low‐Voltage, Optoelectronic CH3NH3PbI3−xClx Memory with Integrated Sensing and Logic Operations
F Zhou, Y Liu, X Shen, M Wang, F Yuan, Y Chai
Advanced Functional Materials 28 (15), 1800080, 2018
2432018
Real-Time Observation of the Electrode-Size-Dependent Evolution Dynamics of the Conducting Filaments in a SiO2 Layer
F Yuan, Z Zhang, C Liu, F Zhou, HM Yau, W Lu, X Qiu, HSP Wong, J Dai, ...
ACS nano 11 (4), 4097-4104, 2017
902017
Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlO x /Pt RRAM device
F Yuan, Z Zhang, JC Wang, L Pan, J Xu, CS Lai
Nanoscale research letters 9, 1-6, 2014
482014
Scaling the CBRAM switching layer diameter to 30 nm improves cycling endurance
S Fujii, JAC Incorvia, F Yuan, S Qin, F Hui, Y Shi, Y Chai, M Lanza, ...
IEEE Electron Device Letters 39 (1), 23-26, 2017
272017
A combined modulation of set current with reset voltage to achieve 2-bit/cell performance for filament-based RRAM
F Yuan, Z Zhang, L Pan, J Xu
IEEE Journal of the Electron Devices Society 2 (6), 154-157, 2014
202014
Hybrid aluminum and indium conducting filaments for nonpolar resistive switching of Al/AlOx/indium tin oxide flexible device
F Yuan, JC Wang, Z Zhang, YR Ye, L Pan, J Xu, CS Lai
Applied Physics Express 7 (2), 024204, 2014
192014
A physics-based compact model for material-and operation-oriented switching behaviors of CBRAM
YD Zhao, JJ Hu, P Huang, F Yuan, Y Chai, XY Liu, JF Kang
2016 IEEE International Electron Devices Meeting (IEDM), 7.6. 1-7.6. 4, 2016
152016
Interface-induced two-step RESET for filament-based multi-level resistive memory
F Yuan, S Shen, Z Zhang, L Pan, J Xu
Superlattices and Microstructures 91, 90-97, 2016
152016
Vertically foldable memory array structure
L Pan, F Yuan
US Patent 8,958,246, 2015
152015
γ-ray irradiation effects on TiN/HfOx/Pt resistive random access memory devices
F Yuan, S Shen, Z Zhang
2015 IEEE Aerospace Conference, 1-7, 2015
112015
Vertical selection transistor, memory cell, and three-dimensional memory array structure and method for fabricating the same
L Pan, F Yuan
US Patent 8,748,934, 2014
92014
Retention behavior of graphene oxide resistive switching memory on flexible substrate
F Yuan, YR Ye, JC Wang, Z Zhang, L Pan, J Xu, CS Lai
2013 IEEE 5th International Nanoelectronics Conference (INEC), 288-290, 2013
82013
Mobility enhancement of strained GaSb p-channel metal–oxide–semiconductor field-effect transistors with biaxial compressive strain
YW Chen, Z Tan, LF Zhao, J Wang, YZ Liu, C Si, F Yuan, WH Duan, J Xu
Chinese Physics B 25 (3), 038504, 2016
52016
Retention behaviour of graphene oxide resistive switching memory
F Yuan, YR Ye, CS Lai, JC Wang, Z Zhang, L Pan, J Xu
International journal of nanotechnology 11 (1-234), 106-115, 2014
52014
In-situ observation of Cu filaments evolution in SiO2 layer
Z Zhang, F Yuan, C Liu, F Zhou, HM Yau, W Lu, XY Qiu, HSP Wong, ...
Microscopy and Microanalysis 23 (S1), 1622-1623, 2017
12017
Total Ionizing Dose (TID) Effects of γ Ray Radiation on Ag/AlOx/Pt Resistive Switching Memory
F Yuan, Z Zhang, S Shen, L Pan, J Xu, Memory Research Team
APS March Meeting Abstracts 2014, C1. 311, 2014
2014
Total Ionizing Dose (TID) Effects of γ Ray Radiation on Filament Based AlOx RRAM
CSL Fang Yuan, Zhigang Zhang, Jer-Chyi Wang*, Liyang Pan, Jun Xu*
2014 International Symposium on Next-Generation Electronics (ISNE), 2014
2014
Bidirectional Unipolar Switching of Al/AlOx/ITO Flexible ReRAM
CSL Fang Yuan, Jer-Chyi Wang*, Zhigang Zhang, Yu-Ren Ye, Liyang Pan, Jun Xu
International Workshop on Dielectric Thin Films for Future Electron Devices …, 2013
2013
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