| Through-silicon-via management during 3D physical design: When to add and how many? M Pathak, YJ Lee, T Moon, SK Lim 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 387-394, 2010 | 89 | 2010 |
| {Many-to-Many} beam alignment in millimeter wave networks S Jog, J Wang, J Guan, T Moon, H Hassanieh, RR Choudhury 16th USENIX Symposium on Networked Systems Design and Implementation (NSDI …, 2019 | 58 | 2019 |
| BlueFMCW: Random frequency hopping radar for mitigation of interference and spoofing T Moon, J Park, S Kim EURASIP Journal on Advances in Signal Processing 2022 (1), 4, 2022 | 37 | 2022 |
| Wideband sparse signal acquisition with dual-rate time-interleaved undersampling hardware and multicoset signal reconstruction algorithms T Moon, HW Choi, N Tzou, A Chatterjee IEEE Transactions on Signal Processing 63 (24), 6486-6497, 2015 | 34 | 2015 |
| Online millimeter wave phased array calibration based on channel estimation T Moon, J Gaun, H Hassanieh 2019 IEEE 37th VLSI Test Symposium (VTS), 1-6, 2019 | 17 | 2019 |
| Low cost sparse multiband signal characterization using asynchronous multi-rate sampling: Algorithms and hardware N Tzou, D Bhatta, BJ Muldrey, T Moon, X Wang, H Choi, A Chatterjee Journal of Electronic Testing 31, 85-98, 2015 | 16 | 2015 |
| An FPGA-based ATE extension module for low-cost multi-GHz memory test DC Keezer, TH Chen, T Moon, DT Stonecypher, A Chatterjee, HW Choi, ... 2015 20th IEEE European Test Symposium (ETS), 1-6, 2015 | 13 | 2015 |
| Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise T Moon, N Tzou, X Wang, H Choi, A Chatterjee 2012 IEEE 30th VLSI Test Symposium (VTS), 146-151, 2012 | 10 | 2012 |
| Know your channel first, then calibrate your mmWave phased array T Moon, J Gaun, H Hassanieh IEEE Design & Test 37 (4), 42-51, 2020 | 6 | 2020 |
| Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms T Moon, HW Choi, DC Keezer, A Chatterjee 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 6 | 2014 |
| Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters X Wang, HW Choi, T Moon, N Tzou, A Chatterjee 2012 IEEE International Test Conference, 1-10, 2012 | 6 | 2012 |
| Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution N Tzou, T Moon, X Wang, H Choi, A Chatterjee 2012 IEEE 30th VLSI Test Symposium (VTS), 140-145, 2012 | 5 | 2012 |
| Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling T Moon, HW Choi, A Chatterjee 2012 IEEE International Test Conference, 1-9, 2012 | 3 | 2012 |
| Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling T Moon, HW Choi, A Chatterjee 2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013 | 2 | 2013 |
| Implement Your DSP Algorithm on Android Tablet: Real-time DSP Laboratory Course T Moon, MN Do ASEE Annual Conference and Exposition, Conference Proceedings, 2021 | 1 | 2021 |
| A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect JY Lei, T Moon, J Chow, SK Sitaraman, A Chatterjee 2018 IEEE 27th Asian Test Symposium (ATS), 191-196, 2018 | 1 | 2018 |
| Timing noise characterization of high-speed digital bit sequences using incoherent subsampling and algorithmic clock recovery HW Choi, T Moon, A Chatterjee IEEE Transactions on Instrumentation and Measurement 63 (12), 2733-2749, 2014 | 1 | 2014 |
| Beyond FFT: Precision Vibration Tracking with FMCW Radar and Kalman Estimators T Moon 2024 IEEE Radar Conference (RadarConf24), 1-6, 2024 | | 2024 |
| Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition T Moon, HW Choi, DC Keezer, A Chatterjee Journal of Electronic Testing 35 (6), 809-822, 2019 | | 2019 |
| 2015 JETTA-TTTC Best Paper Award N Tzou, D Bhatta, BJ Muldrey Jr, T Moon, X Wang, H Choi, A Chatterjee, ... J Electron Test 32, 659-660, 2016 | | 2016 |
