| Charge-Induced Second-Harmonic Generation in Bilayer WSe2 H Yu, D Talukdar, W Xu, JB Khurgin, Q Xiong Nano Letters 15 (8), 5653-5657, 2015 | 122 | 2015 |
| Nonlinearity exponents in lightly doped conducting polymers D Talukdar, UN Nandi, KK Bardhan, CCB Bufon, T Heinzel, A De, ... Physical Review B 84 (5), 054205, 2011 | 31 | 2011 |
| Scaling description of non-ohmic direct current conduction in disordered systems U Nandi, D Jana, D Talukdar Progress in Materials Science 71, 1-92, 2015 | 29 | 2015 |
| Low noise constant current source for bias dependent noise measurements D Talukdar, RK Chakraborty, S Bose, KK Bardhan Review of Scientific Instruments 82, 013906, 2011 | 19 | 2011 |
| Scaling of non-Ohmic conduction in strongly correlated systems D Talukdar, UN Nandi, A Poddar, P Mandal, KK Bardhan Physical Review B 86 (16), 165104, 2012 | 17 | 2012 |
| Universal scaling in disordered systems and non-universal exponents KK Bardhan, D Talukdar, UN Nandi, CD Mukherjee Physical Review B 89 (18), 184201, 2014 | 9 | 2014 |
| Ultra-low noise multiwalled carbon nanotube transistors O Herranen, D Talukdar, M Ahlskog Carbon 76, 71–76, 2014 | 4 | 2014 |
| Linear current fluctuations in the power-law region of metallic carbon nanotubes D Talukdar, P Yotprayoonsak, O Herranen, M Ahlskog Physical Review B 88 (12), 125407, 2013 | 2 | 2013 |
| Bias exponent of resistance noise as a probe for disordered systems AK Dey, U Nandi, D Talukdar, R Chakrabarty, KK Bardhan physica status solidi (b) 255 (9), 1700664, 2018 | 1 | 2018 |
| Carbon nanotube field-effect devices with asymmetric electrode configuration by contact geometry P Yotprayoonsak, D Talukdar, M Ahlskog Journal of Applied Physics 115, 214302, 2014 | 1 | 2014 |
| Gap states controlled transmission through 1D metal-nanotube junction UN Nandi, AK Dey, D Talukdar Carbon 146, 106-115, 2019 | | 2019 |
| Non-linearity and flicker noise in disordered systems D Talukdar UNIVERSITY OF CALCUTTA, Ph.D. Thesis, 2012 | | 2012 |
Jacob B KhurginJohns Hopkins UniversityDirección de correo verificada de jhu.edu