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Tianyi Zhang
Tianyi Zhang
Assistant Professor of Computer Science, Purdue University
Dirección de correo verificada de purdue.edu - Página principal
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Expectation vs. experience: Evaluating the usability of code generation tools powered by large language models
P Vaithilingam, T Zhang, EL Glassman
Chi conference on human factors in computing systems extended abstracts, 1-7, 2022
6352022
Are code examples on an online q&a forum reliable? a study of api misuse on stack overflow
T Zhang, G Upadhyaya, A Reinhardt, H Rajan, M Kim
Proceedings of the 40th international conference on software engineering …, 2018
216*2018
An analysis of adversarial attacks and defenses on autonomous driving models
Y Deng, X Zheng, T Zhang, C Chen, G Lou, M Kim
2020 IEEE international conference on pervasive computing and communications …, 2020
1932020
An empirical study of common challenges in developing deep learning applications
T Zhang, C Gao, L Ma, M Lyu, M Kim
2019 IEEE 30th International Symposium on Software Reliability Engineering …, 2019
1832019
Interactive code review for systematic changes
T Zhang, M Song, J Pinedo, M Kim
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
802015
Visualizing API usage examples at scale
EL Glassman, T Zhang, B Hartmann, M Kim
Proceedings of the 2018 CHI Conference on Human Factors in Computing Systems …, 2018
762018
Interactive Program Synthesis by Augmented Examples
T Zhang, L Lowmanstone, X Wang, EL Glassman
Proceedings of the 33rd Annual ACM Symposium on User Interface Software and …, 2020
682020
Who answers it better? an in-depth analysis of chatgpt and stack overflow answers to software engineering questions
S Kabir, DN Udo-Imeh, B Kou, T Zhang
CoRR, 2023
632023
Testing of autonomous driving systems: where are we and where should we go?
G Lou, Y Deng, X Zheng, M Zhang, T Zhang
Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022
622022
Automated transplantation and differential testing for clones
T Zhang, M Kim
2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017
582017
Jshrink: In-depth investigation into debloating modern java applications
BR Bruce, T Zhang, J Arora, GH Xu, M Kim
Proceedings of the 28th ACM joint meeting on european software engineering …, 2020
572020
Is stack overflow obsolete? an empirical study of the characteristics of chatgpt answers to stack overflow questions
S Kabir, DN Udo-Imeh, B Kou, T Zhang
Proceedings of the CHI Conference on Human Factors in Computing Systems, 1-17, 2024
532024
Dl3dv-10k: A large-scale scene dataset for deep learning-based 3d vision
L Ling, Y Sheng, Z Tu, W Zhao, C Xin, K Wan, L Yu, Q Guo, Z Yu, Y Lu, ...
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024
522024
Analyzing and Supporting Adaptation of Online Code Examples
T Zhang, D Yang, CV Lopes, M Kim
Proceedings of the 41st International Conference on Software Engineering …, 2019
472019
Active inductive logic programming for code search
A Sivaraman, T Zhang, G Van den Broeck, M Kim
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE …, 2019
422019
Enabling Data-Driven API Design with Community Usage Data: A Need-Finding Study
T Zhang, B Hartmann, M Kim, EL Glassman
Proceedings of the 2020 CHI Conference on Human Factors in Computing Systems …, 2020
362020
A declarative metamorphic testing framework for autonomous driving
Y Deng, X Zheng, T Zhang, H Liu, G Lou, M Kim, TY Chen
IEEE Transactions on Software Engineering 49 (4), 1964-1982, 2022
352022
Interpretable program synthesis
T Zhang, Z Chen, Y Zhu, P Vaithilingam, X Wang, EL Glassman
Proceedings of the 2021 CHI Conference on Human Factors in Computing Systems …, 2021
312021
Scenario-based test reduction and prioritization for multi-module autonomous driving systems
Y Deng, X Zheng, M Zhang, G Lou, T Zhang
Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022
282022
BMT: Behavior driven development-based metamorphic testing for autonomous driving models
Y Deng, G Lou, X Zheng, T Zhang, M Kim, H Liu, C Wang, TY Chen
2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET), 32-36, 2021
262021
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