| Advanced capabilities for materials modelling with Quantum ESPRESSO P Giannozzi, O Andreussi, T Brumme, O Bunau, MB Nardelli, M Calandra, ... Journal of Physics: Condensed Matter 29 (46), 465901, 2017 | 8155 | 2017 |
| Efficient calculation of exact exchange and RPA correlation energies in the adiabatic-connection fluctuation-dissipation theory HV Nguyen, S De Gironcoli Physical Review B 79 (20), 205114, 2009 | 187 | 2009 |
| GW calculations using the spectral decomposition of the dielectric matrix: Verification, validation, and comparison of methods TA Pham, HV Nguyen, D Rocca, G Galli Physical Review B 87 (15), 155148, 2013 | 179 | 2013 |
| Improving accuracy and efficiency of calculations of photoemission spectra within the many-body perturbation theory HV Nguyen, TA Pham, D Rocca, G Galli Physical Review B 85 (8), 081101, 2012 | 155 | 2012 |
| A first-principles study of weakly bound molecules using exact exchange and the random phase approximation HV Nguyen, G Galli The Journal of chemical physics 132 (4), 044109, 2010 | 88 | 2010 |
| van der Waals Interactions in Molecular Assemblies from First-Principles Calculations Y Li, D Lu, HV Nguyen, G Galli The Journal of Physical Chemistry A 114 (4), 1944-1952, 2009 | 69 | 2009 |
| Power series expansion of the random phase approximation correlation energy: The role of the third-and higher-order contributions D Lu, HV Nguyen, G Galli The Journal of chemical physics 133 (15), 154110, 2010 | 63 | 2010 |
| Geometry of Einstein-Podolsky-Rosen Correlations HC Nguyen, HV Nguyen, O Gühne Physical Review Letters 122 (24), 240401, 2019 | 49 | 2019 |
| Enhanced thermoelectric figure of merit in vertical graphene junctions VH Nguyen, MC Nguyen, HV Nguyen, J Saint-Martin, P Dollfus Applied Physics Letters 105 (13), 133105, 2014 | 46 | 2014 |
| Disorder effects on electronic bandgap and transport in graphene-nanomesh-based structures VH Nguyen, MC Nguyen, HV Nguyen, P Dollfus Journal of Applied Physics 113 (1), 013702, 2013 | 46 | 2013 |
| Enhanced Seebeck effect in graphene devices by strain and doping engineering MC Nguyen, VH Nguyen, HV Nguyen, J Saint-Martin, P Dollfus Physica E: Low-dimensional Systems and Nanostructures 73, 207-212, 2015 | 32 | 2015 |
| Band offsets and dielectric properties of the amorphous Si3N4/Si (100) interface: A first-principles study TA Pham, T Li, HV Nguyen, S Shankar, F Gygi, G Galli Applied Physics Letters 102 (24), 241603, 2013 | 31 | 2013 |
| Improved performance of graphene transistors by strain engineering VH Nguyen, HV Nguyen, P Dollfus Nanotechnology 25 (16), 165201, 2014 | 28 | 2014 |
| Density-functional description of polymer crystals: A comparative study of recent van der Waals functionals TH Pham, R Ramprasad, HV Nguyen The Journal of Chemical Physics 144 (21), 214905, 2016 | 17 | 2016 |
| Conduction gap in graphene strain junctions: direction dependence MC Nguyen, VH Nguyen, HV Nguyen, P Dollfus Semiconductor Science and Technology 29 (11), 115024, 2014 | 16 | 2014 |
| Magnetic properties of exchange-biased three-layer films in a perpendicular magnetic field VT Ngo, HV Nguyen, HT Diep, VL Nguyen Physical Review B 69 (13), 134429, 2004 | 16 | 2004 |
| Van der Waals coefficients of atoms and molecules from a simple approximation for the polarizability HV Nguyen, S De Gironcoli Physical Review B 79 (11), 115105, 2009 | 15 | 2009 |
| Strain-induced conduction gap in vertical devices made of misoriented graphene layers VH Nguyen, HV Nguyen, J Saint-Martin, P Dollfus Nanotechnology 26 (11), 115201, 2015 | 14 | 2015 |
| Structural and Electronic Properties of Defect‐Free and Defect‐Containing Polypropylene: A Computational Study by van der Waals Density‐Functional Method HV Nguyen, TH Pham physica status solidi (b) 255 (3), 1700036, 2018 | 12 | 2018 |
| Strong negative differential conductance in strained graphene devices MC Nguyen, VH Nguyen, HV Nguyen, P Dollfus Journal of Applied Physics 118 (23), 234306, 2015 | 8 | 2015 |
Giulia GalliLiew Family Professor of Molecular Engineering, Professor of Chemistry,University of ChicagoDirección de correo verificada de uchicago.edu
