Lucille A. Giannuzzi

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Joseph MichaelSandia National LaboratoriesDirección de correo verificada de sandia.gov
Lena F. KourkoutisAssociate Professor of Applied and Engineering Physics, CornellDirección de correo verificada de cornell.edu
David A MullerProfessor of Applied and Engineering Physics, Cornell UniversityDirección de correo verificada de cornell.edu
Bradley NewcombGeneral MotorsDirección de correo verificada de gm.com
Satish KumarProfessor of Materials Science and Engineering, Georgia Institute of TechnologyDirección de correo verificada de gatech.edu
Han Gi ChaeUlsan National Institute of Science and TechnologyDirección de correo verificada de unist.ac.kr
Prabhakar GulgunjeGeorgia Institute of Technology AtlantaDirección de correo verificada de mse.gatech.edu
Catherine VartuliApple, Texas Instruments, Lucent Technologies, University of FloridaDirección de correo verificada de apple.com
Michael HamptonProfessor of Chemistry, University of Central FloridaDirección de correo verificada de ucf.edu
Ben LichFEIDirección de correo verificada de fei.com
Keana ScottNational Institute of Standards and TechnologyDirección de correo verificada de nist.gov
Charles E. BakisEngineering Science and Mechanics, Pennsylvania State UniversityDirección de correo verificada de psu.edu
Alexander H. KingIowa State UniversityDirección de correo verificada de iastate.edu
Kevin M. LyonsNorth Carolina State UniversityDirección de correo verificada de ncsu.edu
Peter J. HeaneyProfessor of Geosciences, Penn State UniversityDirección de correo verificada de psu.edu
Kenneth J. T. LiviDirector, Materials Characterization and Processing Center, Johns Hopkins UniversityDirección de correo verificada de jhu.edu
Edward P. VicenziSmithsonian InstitutionDirección de correo verificada de si.edu
Barbara GarrisonPenn State UniversityDirección de correo verificada de psu.edu
Michael AntonellSr. Director of Engineering, QorvoDirección de correo verificada de qorvo.com
Jon HillerTescanDirección de correo verificada de tescan-usa.com

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Lucille A. Giannuzzi

President, L.A. Giannuzzi & Associates LLC, EXpressLO LLC, TESCAN USA

Dirección de correo verificada de lagiannuzzi.com - Página principal

FIB SEM TEM EBSD lift out


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
A review of focused ion beam milling techniques for TEM specimen preparation LA Giannuzzi, FA Stevie Micron 30 (3), 197-204, 1999	1624	1999
Introduction to focused ion beams: instrumentation, theory, techniques and practice LA Giannuzzi Springer Science & Business Media, 2004	1603	2004
TEM sample preparation and FIB-induced damage J Mayer, LA Giannuzzi, T Kamino, J Michael MRS bulletin 32 (5), 400-407, 2007	1117	2007
High-temperature interface superconductivity between metallic and insulating copper oxides A Gozar, G Logvenov, LF Kourkoutis, AT Bollinger, LA Giannuzzi, ... Nature 455 (7214), 782-785, 2008	658	2008
Site-specific 3D imaging of cells and tissues with a dual beam microscope JAW Heymann, M Hayles, I Gestmann, LA Giannuzzi, B Lich, ... Journal of structural biology 155 (1), 63-73, 2006	409	2006
Applications of the FIB lift‐out technique for TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie Microscopy research and technique 41 (4), 285-290, 1998	350	1998
High strength and high modulus carbon fibers HG Chae, BA Newcomb, PV Gulgunje, Y Liu, KK Gupta, MG Kamath, ... Carbon 93, 81-87, 2015	267	2015
Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie MRS Online Proceedings Library 480 (1), 19-27, 1997	257	1997
Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials PJ Heaney, EP Vicenzi, LA Giannuzzi, KJT Livi American Mineralogist 86 (9), 1094-1099, 2001	240	2001
Recent advances in focused ion beam technology and applications N Bassim, K Scott, LA Giannuzzi Mrs Bulletin 39 (4), 317-325, 2014	196	2014
2 keV Ga+ FIB milling for reducing amorphous damage in silicon LA Giannuzzi, R Geurts, J Ringnalda Microscopy and Microanalysis 11 (S02), 828-829, 2005	161	2005
The correlation between ion beam/material interactions and practical FIB specimen preparation BI Prenitzer, CA Urbanik-Shannon, LA Giannuzzi, SR Brown, RB Irwin, ... Microscopy and Microanalysis 9 (3), 216-236, 2003	143	2003
Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis FA Stevie, CB Vartuli, LA Giannuzzi, TL Shofner, SR Brown, B Rossie, ... Surface and Interface Analysis: An International Journal devoted to the …, 2001	142	2001
Ion channeling effects on the focused ion beam milling of Cu BW Kempshall, SM Schwarz, BI Prenitzer, LA Giannuzzi, RB Irwin, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001	137	2001
FIB lift-out specimen preparation techniques: ex-situ and in-situ methods LA Giannuzzi, BW Kempshall, SM Schwarz, JK Lomness, BI Prenitzer, ... Introduction to focused ion beams: instrumentation, theory, techniques and …, 2005	135	2005
Electron backscattering diffraction investigation of focused ion beam surfaces TL Matteson, SW Schwarz, EC Houge, BW Kempshall, LA Giannuzzi Journal of Electronic Materials 31, 33-39, 2002	108	2002
Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique BI Prenitzer, LA Giannuzzi, K Newman, SR Brown, RB Irwin, FA Stevie, ... Metallurgical and Materials Transactions A 29, 2399-2406, 1998	107	1998
Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy LA Giannuzzi, D Phifer, NJ Giannuzzi, MJ Capuano Journal of Oral and Maxillofacial Surgery 65 (4), 737-747, 2007	104	2007
High resolution transmission electron microscopy study on polyacrylonitrile/carbon nanotube based carbon fibers and the effect of structure development on the thermal and … BA Newcomb, LA Giannuzzi, KM Lyons, PV Gulgunje, K Gupta, Y Liu, ... Carbon 93, 502-514, 2015	97	2015
Wet thermal oxidation of GaN ED Readinger, SD Wolter, DL Waltemyer, JM Delucca, SE Mohney, ... Journal of electronic materials 28, 257-260, 1999	97	1999

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