Lutterotti Luca

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Daniel ChateignerNormandie Université, CRISMAT, CNRS, ENSICAEN, IUT-Caen, UNICAENDirección de correo verificada de ensicaen.fr
Stefano GialanellaDirección de correo verificada de unitn.it
Mauro BortolottiUniversità di TrentoDirección de correo verificada de unitn.it
Saulius GrazulisSenior research fellow, Vilnius University, Life Sciences Center, Institute of BiotechnologyDirección de correo verificada de ibt.lt
Sven C. VogelTechnical staff member at Los Alamos National Laboratory, LANL, HIPPO beamline scientistDirección de correo verificada de lanl.gov
Armel Le BailDirecteur de Recherche CNRS, Université du MaineDirección de correo verificada de univ-lemans.fr
Robert T DownsUniversity of ArizonaDirección de correo verificada de u.arizona.edu
Andrius MerkysResearcher, Vilnius University Institute of BiotechnologyDirección de correo verificada de ibt.lt
Jesús RicoteInstituto de Ciencia de Materiales de Madrid. CSICDirección de correo verificada de csic.es
Maria D. BaroProf. Applied Physics, Dept. Physics, UABDirección de correo verificada de uab.es
Roman VasinJoint Institute for Nuclear ResearchDirección de correo verificada de nf.jinr.ru
Gino MariottoUniversità degli Studi di VeronaDirección de correo verificada de univr.it
Magali MoralesNormandie Université, CIMAP-ENSICAEN, ESPE-Caen, Université de Caen NormandieDirección de correo verificada de ensicaen.fr
Leonardo PalmisanoFull Professor of Chemistry, FRSC - University of Palermo, ItalyDirección de correo verificada de unipa.it
Michele ZucaliUniversità degli Studi di MilanoDirección de correo verificada de unimi.it
Josep NoguesInstitut Catala de Nanociencia i NanotecnologiaDirección de correo verificada de uab.cat
Lowell MiyagiProfessor Geology and Geophysics, University of UtahDirección de correo verificada de utah.edu
Pamela KaercherUniversity of California, BerkeleyDirección de correo verificada de berkeley.edu
Waruntorn KanitpanyacharoenAssistant Professor, Chulalongkorn UniversityDirección de correo verificada de chula.ac.th
Ulf OlofssonProfessor i TribologyDirección de correo verificada de kth.se

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Lutterotti Luca

University of Trento

Dirección de correo verificada de unitn.it - Página principal

Materials Science and Engineering Crystallographic texture X-ray diffraction X-ray fluorescence Crystallography


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
Crystallography Open Database–an open-access collection of crystal structures S Gražulis, D Chateigner, RT Downs, AFT Yokochi, M Quirós, L Lutterotti, ... Journal of applied crystallography 42 (4), 726-729, 2009	1882	2009
Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration S Gražulis, A Daškevič, A Merkys, D Chateigner, L Lutterotti, M Quiros, ... Nucleic acids research 40 (D1), D420-D427, 2012	1322	2012
MAUD: a friendly Java program for material analysis using diffraction L Lutterotti, S Matthies, HR Wenk Newsletter of the CPD 21, 14-15, 1999	1282*	1999
Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction L Lutterotti Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010	1202	2010
Combined Texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra L Lutterotti, S Matthies, HR Wenk, AS Schultz, R Jr. J. Applied Physics 81 (2), 594-600, 1997	993	1997
Simultaneous structure and size–strain refinement by the Rietveld method L Lutterotti, P Scardi Journal of applied Crystallography 23 (4), 246-252, 1990	888	1990
Rietveld texture analysis from diffraction images L Lutterotti, M Bortolotti, G Ischia, I Lonardelli, HR Wenk Z. Kristallogr. Suppl 26, 125-130, 2007	539	2007
Texture, residual stress and structural analysis of thin films using a combined X-ray analysis L Lutterotti, D Chateigner, S Ferrari, J Ricote Thin Solid Films 450 (1), 34-41, 2004	528	2004
MAUD (material analysis using diffraction): a user friendly Java program for Rietveld texture analysis and more L Lutterotti, H Wenk, S Matthies Proceeding of the twelfth international conference on textures of materials …, 1999	485	1999
Texture analysis with the new HIPPO TOF diffractometer HR Wenk, L Lutterotti, S Vogel Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003	442	2003
Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction M Ferrari, L Lutterotti Journal of Applied Physics 76 (11), 7246-7255, 1994	437	1994
X-ray diffraction characterization of heavily deformed metallic specimens L Lutterotti, S Gialanella Acta Materialia 46 (1), 101-110, 1998	382	1998
LSI-a computer program for simultaneous refinement of material structure and microstructure L Lutterotti, P Scardi, P Maistrelli Journal of applied crystallography 25 (3), 459-462, 1992	305	1992
Quantitative analysis of silicate glass in ceramic materials by the Rietveld method L Lutterotti, R Ceccato, R Dal Maschio, E Pagani Materials Science Forum 278 (281), 87-92, 1998	297	1998
Maud: a Rietveld analysis program designed for the internet and experiment integration L Lutterotti Acta Crystallogr. Sect. A Found. Crystallogr 56, s54, 2000	245	2000
Rietveld texture analysis from TOF neutron diffraction data HR Wenk, L Lutterotti, SC Vogel Powder Diffraction 25 (3), 283-296, 2010	230	2010
In situ observation of texture evolution during α→ β and β→ α phase transformations in titanium alloys investigated by neutron diffraction I Lonardelli, N Gey, HR Wenk, M Humbert, SC Vogel, L Lutterotti Acta Materialia 55 (17), 5718-5727, 2007	226	2007
Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis L Lutterotti, R Vasin, HR Wenk Powder Diffraction 29 (1), 76-84, 2014	205	2014
Advances in texture analysis from diffraction spectra S Matthies, L Lutteroti, HR Wenk Journal of Applied Crystallography 30 (1), 31-42, 1997	195	1997
Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method SC Vogel, C Hartig, L Lutterotti, RB Von Dreele, HR Wenk, DJ Williams Powder Diffraction 19 (1), 65-68, 2004	167	2004

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