Automation of trimming die design inspection by zigzag process between AI and CAD domains JS Lee, TH Kim, SH Jeon, SH Park, SH Kim, EH Lee, JH Lee Engineering Applications of Artificial Intelligence 127, 107283, 2024 | 15 | 2024 |
Automatic defect classification using semi-supervised learning with defect localization Y Kim, JS Lee, JH Lee IEEE Transactions on Semiconductor Manufacturing 36 (3), 476-485, 2023 | 7 | 2023 |
Learning with structural labels for learning with noisy labels N Kim, JS Lee, JH Lee Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024 | 4 | 2024 |
DomCLP: Domain-wise Contrastive Learning with Prototype Mixup for Unsupervised Domain Generalization JS Lee, N Kim, JH Lee arXiv preprint arXiv:2412.09074, 2024 | | 2024 |
CAFTTA: Mitigating Unseen Class Forgetting in Test-Time Adaptation with Knowledge Fusion BJ Lee, JS Lee, JH Lee 2024 Joint 13th International Conference on Soft Computing and Intelligent …, 2024 | | 2024 |
ExMatch: Self-guided Exploitation for Semi-supervised Learning with Scarce Labeled Samples N Kim, JS Lee, JH Lee European Conference on Computer Vision, 125-142, 2024 | | 2024 |
IGNORE: Information Gap-Based False Negative Loss Rejection for Single Positive Multi-Label Learning GR Song, N Kim, JS Lee, JH Lee European Conference on Computer Vision, 472-488, 2024 | | 2024 |