دنبال کردن
Pedro C. Feijoo
Pedro C. Feijoo
نام‌های دیگرPedro Carlos Feijoo Guerro, P. C. Feijoo
ایمیل تأیید شده در upm.es
عنوان
نقل شده توسط
نقل شده توسط
سال
Short channel effects in graphene-based field effect transistors targeting radio-frequency applications
PC Feijoo, D Jiménez, X Cartoixà
2D Materials 3 (2), 025036, 2016
382016
Compact modeling technology for the simulation of integrated circuits based on graphene field‐effect transistors
F Pasadas, PC Feijoo, N Mavredakis, A Pacheco‐Sanchez, FA Chaves, ...
Advanced Materials 34 (48), 2201691, 2022
302022
Scaling of graphene field-effect transistors supported on hexagonal boron nitride: Radio-frequency stability as a limiting factor
PC Feijoo, F Pasadas, JM Iglesias, MJ Martín, R Rengel, C Li, W Kim, ...
Nanotechnology 28 (48), 485203, 2017
272017
Scandium oxide deposited by high-pressure sputtering for memory devices: Physical and interfacial properties
PC Feijoo, A Del Prado, M Toledano-Luque, E San Andrés, ML Lucía
Journal of Applied Physics 107 (8), 2010
242010
Experimental observation and modeling of the impact of traps on static and analog/HF performance of graphene transistors
A Pacheco-Sanchez, N Mavredakis, PC Feijoo, W Wei, E Pallecchi, ...
IEEE Transactions on Electron Devices 67 (12), 5790-5796, 2020
192020
Radio frequency performance projection and stability tradeoff of h-BN encapsulated graphene field-effect transistors
PC Feijoo, F Pasadas, JM Iglesias, R Rengel, D Jiménez
IEEE Transactions on Electron Devices 66 (3), 1567-1573, 2019
182019
Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs
PC Feijoo, T Kauerauf, M Toledano-Luque, M Togo, E San Andrés, ...
IEEE Transactions on Device and Materials Reliability 12 (1), 166-170, 2012
162012
Plasma oxidation of silicon in a microwave discharge and its specificity
J Musil, F Zacek, L Bardos, G Loncar, R Dragila
Journal of Physics D: Applied Physics 12 (5), L61, 1979
161979
Contact resistance extraction of graphene FET technologies based on individual device characterization
A Pacheco-Sanchez, PC Feijoo, D Jiménez
Solid-State Electronics 172, 107882, 2020
152020
Optimization of scandium oxide growth by high pressure sputtering on silicon
PC Feijoo, MA Pampillón, E San Andrés, ML Lucía
Thin Solid Films 526, 81-86, 2012
152012
Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation
MÁ Pampillón, PC Feijoo, E San Andrés
Microelectronic engineering 109, 236-239, 2013
132013
Optimization of gadolinium oxide growth deposited on Si by high pressure sputtering
PC Feijoo, MÁ Pampillón, ES Andrés
Journal of Vacuum Science & Technology B 31 (1), 2013
132013
Optimization of in situ plasma oxidation of metallic gadolinium thin films deposited by high pressure sputtering on silicon
MÁ Pampillón, PC Feijoo, E San Andrés, ML Lucía
Journal of Vacuum Science & Technology B 31 (1), 2013
132013
Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering
MA Pampillon, PC Feijoo, E San Andres, ML Lucía, A Del Prado, ...
Microelectronic engineering 88 (9), 2991-2996, 2011
132011
Towards metal electrode interface scavenging of rare-earth scandates: A Sc2O3 and Gd2O3 study
MA Pampillón, PC Feijoo, E San Andrés, M Toledano-Luque, A Del Prado, ...
Microelectronic engineering 88 (7), 1357-1360, 2011
132011
2D pn junctions driven out-of-equilibrium
FA Chaves, PC Feijoo, D Jiménez
Nanoscale advances 2 (8), 3252-3262, 2020
122020
Nano-laminate vs. direct deposition of high permittivity gadolinium scandate on silicon by high pressure sputtering
PC Feijoo, MA Pampillón, E San Andrés, JLG Fierro
Thin Solid Films 593, 62-66, 2015
102015
An extraction method for mobility degradation and contact resistance of graphene transistors
A Pacheco-Sanchez, N Mavredakis, PC Feijoo, D Jiménez
IEEE Transactions on Electron Devices 69 (7), 4037-4041, 2022
92022
Unveiling the impact of the bias-dependent charge neutrality point on graphene based multi-transistor applications
F Pasadas, A Medina-Rull, PC Feijoo, A Pacheco-Sanchez, EG Marin, ...
Nano Express 2 (3), 036001, 2021
92021
Does carrier velocity saturation help to enhance f max in graphene field-effect transistors?
PC Feijoo, F Pasadas, M Bonmann, M Asad, X Yang, A Generalov, ...
Nanoscale advances 2 (9), 4179-4186, 2020
92020
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مقاله‌ها 1–20