| Diffusion barrier with 30-fold improved performance using AlCrTaTiZrN high-entropy alloy P Kumar, S Avasthi Journal of Alloys and Compounds 814, 151755, 2020 | 40 | 2020 |
| Transparent conductive Ta/Al/Ta-grid electrode for optoelectronic and electromagnetic interference shielding applications P Kumar, PV Reddy, B Choudhury, P Chowdhury, HC Barshilia Thin Solid Films 612, 350-357, 2016 | 25 | 2016 |
| Fully dense, highly conductive nanocrystalline TiN diffusion barrier on steel via reactive high power impulse magnetron sputtering P Kumar, M Gupta, S Avasthi Thin Solid Films 722, 138578, 2021 | 7 | 2021 |
| Room-temperature single-electron tunneling in highly-doped silicon-on-insulator nanoscale field-effect transistors TT Jupalli, A Debnath, G Prabhudesai, K Yamaguchi, PJ Kumar, Y Ono, ... Applied Physics Express 15 (6), 065003, 2022 | 6 | 2022 |
| Excited State Spectroscopy and Spin Splitting in Single Layer MoS2 Quantum Dots P Kumar, H Kim, S Tripathy, K Watanabe, T Taniguchi, KS Novoselov, ... Recent Progress in Graphene and 2D materials Research (RPGR 2023), 2023 | 5 | 2023 |
| Hundred-fold reduction in Iron diffusivity in titanium nitride diffusion barrier on steel by microstructure engineering P Kumar, MA Jithin, S Mohan, S Avasthi Thin Solid Films 716, 138416, 2020 | 5 | 2020 |
| Optimization of controlled two-step liquid phase crystallization of Ge-on-Si S Kumar, P Kumar, K Kumari, S Avasthi 2018 4th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2018 | 4 | 2018 |
| Interfacial Stress Transfer and Fracture in van der Waals Heterostructures KSN Zheling Li, Mufeng Liu, Pankaj Kumar, Zhenghua Chang, Guocheng Qi, Pei ... Advanced Materials, 2024 | 1 | 2024 |
| Single Electron Quantum Dot in Two-Dimensional Transition Metal Dichalcogenides J Pawłowski, P Kumar, K Watanabe, T Taniguchi, KS Novoselov, ... arXiv preprint arXiv:2402.19480, 2024 | | 2024 |
| Excited state spectroscopy and spin splitting in atomically thin quantum dots P Kumar, H Kim, S Tripathy, K Watanabe, T Taniguchi, KS Novoselov, ... arXiv preprint arXiv:2303.15425, 2023 | | 2023 |
| SIMS characterization of TiN diffusion barrier layer on steel substrate P Kumar, JM Arvind, S Mohan, S Avasthi 2018 4th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2018 | | 2018 |
Sushobhan AvasthiIndian Institute of Scienceایمیل تأیید شده در iisc.ac.in
