Matrix codes for reliable and cost efficient memory chips C Argyrides, DK Pradhan, T Kocak IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (3), 420-428, 2009 | 141 | 2009 |
Matrix codes: Multiple bit upsets tolerant method for SRAM memories C Argyrides, HR Zarandi, DK Pradhan 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 64 | 2007 |
Matrix-based codes for adjacent error correction CA Argyrides, P Reviriego, DK Pradhan, JA Maestro IEEE Transactions on Nuclear Science 57 (4), 2106-2111, 2010 | 62 | 2010 |
Extending 3-bit burst error-correction codes with quadruple adjacent error correction J Li, P Reviriego, L Xiao, C Argyrides, J Li IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (2), 221-229, 2017 | 49 | 2017 |
Fast SEU detection and correction in LUT configuration bits of SRAM-based FPGAs HR Zarandi, SG Miremadi, C Argyrides, DK Pradhan 2007 IEEE International Parallel and Distributed Processing Symposium, 1-6, 2007 | 36 | 2007 |
Efficient error detection in Double Error Correction BCH codes for memory applications P Reviriego, C Argyrides, JA Maestro Microelectronics Reliability 52 (7), 1528-1530, 2012 | 35 | 2012 |
Improved decoding algorithm for high reliable reed muller coding C Argyrides, DK Pradhan 2007 IEEE International SOC Conference, 95-98, 2007 | 31 | 2007 |
Multiple upsets tolerance in SRAM memory C Argyrides, HR Zarandi, DK Pradhan 2007 IEEE International Symposium on Circuits and Systems (ISCAS), 365-368, 2007 | 29 | 2007 |
Reliability analysis of H-tree random access memories implemented with built in current sensors and parity codes for multiple bit upset correction C Argyrides, R Chipana, F Vargas, DK Pradhan IEEE Transactions on Reliability 60 (3), 528-537, 2011 | 27 | 2011 |
Single element correction in sorting algorithms with minimum delay overhead CA Argyrides, CA Lisboa, DK Pradhan, L Carro 2009 10th Latin American Test Workshop, 1-6, 2009 | 26 | 2009 |
Improving memory reliability against soft errors using block parity P Reviriego, C Argyrides, JA Maestro, DK Pradhan IEEE Transactions on Nuclear Science 58 (3), 981-986, 2011 | 22 | 2011 |
Fault tolerant single error correction encoders JA Maestro, P Reviriego, C Argyrides, DK Pradhan Journal of Electronic Testing 27, 215-218, 2011 | 20 | 2011 |
Algorithm level fault tolerance: a technique to cope with long duration transient faults in matrix multiplication algorithms CAL Lisboa, C Argyrides, DK Pradhan, L Carro 26th IEEE VLSI Test Symposium (vts 2008), 363-370, 2008 | 12 | 2008 |
Single error correcting finite field multipliers over GF (2m) J Mathew, A Costas, AM Jabir, H Rahaman, DK Pradhan 21st International Conference on VLSI Design (VLSID 2008), 33-38, 2008 | 11 | 2008 |
Embedding current monitoring in H-tree RAM architecture for multiple SEU tolerance and reliability improvement C Argyrides, F Vargas, M Moraes, DK Pradhan 2008 14th IEEE International On-Line Testing Symposium, 155-160, 2008 | 10 | 2008 |
Using single error correction codes to protect against isolated defects and soft errors C Argyrides, P Reviriego, JA Maestro IEEE Transactions on Reliability 62 (1), 238-243, 2013 | 9 | 2013 |
Decimal Hamming: a software-implemented technique to cope with soft errors C Argyrides, RR Ferreira, CA Lisboa, L Carro 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 9 | 2011 |
A soft error robust and power aware memory design C Argyrides, CA Lisboa, L Carro, DK Pradhan Proceedings of the 20th annual conference on Integrated circuits and systems …, 2007 | 8 | 2007 |
A fast error correction technique for matrix multiplication algorithms C Argyrides, CAL Lisboa, DK Pradhan, L Carro 2009 15th IEEE International On-Line Testing Symposium, 133-137, 2009 | 7 | 2009 |
Correction masking: a technique to implement efficient SET tolerant error correction decoders H Liu, P Reviriego, C Argyrides, L Xiao IEEE Transactions on Device and Materials Reliability 22 (1), 36-41, 2021 | 6 | 2021 |