Seuraa
Rao Muhammad Anwer
Rao Muhammad Anwer
Mohamed bin Zayed University of Artificial Intelligence (MBZUAI)
Vahvistettu sähköpostiosoite verkkotunnuksessa aalto.fi
Nimike
Viittaukset
Viittaukset
Vuosi
Color attributes for object detection
FS Khan, RM Anwer, J Van De Weijer, AD Bagdanov, M Vanrell, ...
2012 IEEE Conference on Computer Vision and Pattern Recognition, 3306-3313, 2012
4042012
Binary patterns encoded convolutional neural networks for texture recognition and remote sensing scene classification
RM Anwer, FS Khan, J Van De Weijer, M Molinier, J Laaksonen
ISPRS journal of photogrammetry and remote sensing 138, 74-85, 2018
2862018
Edgenext: efficiently amalgamated cnn-transformer architecture for mobile vision applications
M Maaz, A Shaker, H Cholakkal, S Khan, SW Zamir, RM Anwer, ...
European conference on computer vision, 3-20, 2022
2562022
Mask-guided attention network for occluded pedestrian detection
Y Pang, J Xie, MH Khan, RM Anwer, FS Khan, L Shao
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
2472019
Sipmask: Spatial information preservation for fast image and video instance segmentation
J Cao, RM Anwer, H Cholakkal, FS Khan, Y Pang, L Shao
Computer Vision–ECCV 2020: 16th European Conference, Glasgow, UK, August 23 …, 2020
2342020
D2det: Towards high quality object detection and instance segmentation
J Cao, H Cholakkal, RM Anwer, FS Khan, Y Pang, L Shao
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2020
2212020
Transformers in remote sensing: A survey
AA Aleissaee, A Kumar, RM Anwer, S Khan, H Cholakkal, GS Xia, ...
Remote Sensing 15 (7), 1860, 2023
2002023
Coloring action recognition in still images
FS Khan, R Muhammad Anwer, J Van De Weijer, AD Bagdanov, ...
International journal of computer vision 105, 205-221, 2013
1642013
Glamm: Pixel grounding large multimodal model
H Rasheed, M Maaz, S Shaji, A Shaker, S Khan, H Cholakkal, RM Anwer, ...
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2024
1632024
Deep contextual attention for human-object interaction detection
T Wang, RM Anwer, MH Khan, FS Khan, Y Pang, L Shao, J Laaksonen
Proceedings of the IEEE/CVF International Conference on Computer Vision …, 2019
1562019
Foundation Models Defining a New Era in Vision: a Survey and Outlook
M Awais, M Naseer, S Khan, RM Anwer, H Cholakkal, M Shah, MH Yang, ...
IEEE Transactions on Pattern Analysis and Machine Intelligence, 2025
1412025
Spatio-temporal relation modeling for few-shot action recognition
A Thatipelli, S Narayan, S Khan, RM Anwer, FS Khan, B Ghanem
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2022
1402022
Learning rich features at high-speed for single-shot object detection
T Wang, RM Anwer, H Cholakkal, FS Khan, Y Pang, L Shao
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
1382019
Efficient featurized image pyramid network for single shot detector
Y Pang, T Wang, RM Anwer, FS Khan, L Shao
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2019
1282019
Xraygpt: Chest radiographs summarization using medical vision-language models
O Thawkar, A Shaker, SS Mullappilly, H Cholakkal, RM Anwer, S Khan, ...
arXiv preprint arXiv:2306.07971, 2023
1222023
Person image synthesis via denoising diffusion model
AK Bhunia, S Khan, H Cholakkal, RM Anwer, J Laaksonen, M Shah, ...
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2023
1202023
Class-agnostic object detection with multi-modal transformer
M Maaz, H Rasheed, S Khan, FS Khan, RM Anwer, MH Yang
European conference on computer vision, 512-531, 2022
1052022
Enriched feature guided refinement network for object detection
J Nie, RM Anwer, H Cholakkal, FS Khan, Y Pang, L Shao
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
1052019
Semantic pyramids for gender and action recognition
FS Khan, J Van De Weijer, RM Anwer, M Felsberg, C Gatta
IEEE transactions on image processing 23 (8), 3633-3645, 2014
882014
Compact color–texture description for texture classification
FS Khan, RM Anwer, J Van De Weijer, M Felsberg, J Laaksonen
Pattern recognition letters 51, 16-22, 2015
712015
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