Seuraa
Sangdoo Yun
Sangdoo Yun
NAVER AI Lab
Vahvistettu sähköpostiosoite verkkotunnuksessa navercorp.com - Kotisivu
Nimike
Viittaukset
Viittaukset
Vuosi
Cutmix: Regularization strategy to train strong classifiers with localizable features
S Yun, D Han, SJ Oh, S Chun, J Choe, Y Yoo
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
61302019
Character region awareness for text detection
Y Baek, B Lee, D Han, S Yun, H Lee
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2019
12242019
The sixth visual object tracking vot2018 challenge results
M Kristan, A Leonardis, J Matas, M Felsberg, R Pflugfelder, ...
Proceedings of the European conference on computer vision (ECCV) workshops, 0-0, 2018
9952018
A comprehensive overhaul of feature distillation
B Heo, J Kim, S Yun, H Park, N Kwak, JY Choi
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
7282019
Rethinking spatial dimensions of vision transformers
B Heo, S Yun, D Han, S Chun, J Choe, SJ Oh
Proceedings of the IEEE/CVF international conference on computer vision …, 2021
7142021
What is wrong with scene text recognition model comparisons? dataset and model analysis
J Baek, G Kim, J Lee, S Park, D Han, S Yun, SJ Oh, H Lee
Proceedings of the IEEE/CVF international conference on computer vision …, 2019
6952019
Action-Decision Networks for Visual Tracking with Deep Reinforcement Learning
S Yun, J Choi, YJ Yoo, K Yun, JY Choi
Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 2017
6252017
Knowledge transfer via distillation of activation boundaries formed by hidden neurons
B Heo, M Lee, S Yun, JY Choi
Proceedings of the AAAI conference on artificial intelligence 33 (01), 3779-3787, 2019
6152019
Ocr-free document understanding transformer
G Kim, T Hong, M Yim, JY Nam, J Park, J Yim, W Hwang, S Yun, D Han, ...
European Conference on Computer Vision, 498-517, 2022
422*2022
Attentional correlation filter network for adaptive visual tracking
J Choi, H Jin Chang, S Yun, T Fischer, Y Demiris, J Young Choi
Proceedings of the IEEE conference on computer vision and pattern …, 2017
3852017
Learning de-biased representations with biased representations
H Bahng, S Chun, S Yun, J Choo, SJ Oh
International conference on machine learning, 528-539, 2020
3362020
Context-aware deep feature compression for high-speed visual tracking
J Choi, HJ Chang, T Fischer, S Yun, K Lee, J Jeong, Y Demiris, JY Choi
Proceedings of the IEEE conference on computer vision and pattern …, 2018
2562018
Slowing down the weight norm increase in momentum-based optimizers
B Heo, S Chun, SJ Oh, D Han, S Yun, Y Uh, JW Ha
arXiv preprint arXiv:2006.08217 14, 2020
213*2020
The majority can help the minority: Context-rich minority oversampling for long-tailed classification
S Park, Y Hong, B Heo, S Yun, JY Choi
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2022
1832022
Re-labeling imagenet: from single to multi-labels, from global to localized labels
S Yun, SJ Oh, B Heo, D Han, J Choe, S Chun
Proceedings of the IEEE/CVF conference on computer vision and pattern …, 2021
1782021
Dataset condensation via efficient synthetic-data parameterization
JH Kim, J Kim, SJ Oh, S Yun, H Song, J Jeong, JW Ha, HO Song
International Conference on Machine Learning, 11102-11118, 2022
1762022
Knowledge distillation with adversarial samples supporting decision boundary
B Heo, M Lee, S Yun, JY Choi
Proceedings of the AAAI conference on artificial intelligence 33 (01), 3771-3778, 2019
1692019
Rethinking channel dimensions for efficient model design
D Han, S Yun, B Heo, YJ Yoo
Proceedings of the IEEE/CVF conference on Computer Vision and Pattern …, 2021
161*2021
Prometheus: Inducing fine-grained evaluation capability in language models
S Kim, J Shin, Y Cho, J Jang, S Longpre, H Lee, S Yun, S Shin, S Kim, ...
The Twelfth International Conference on Learning Representations, 2023
1432023
Propile: Probing privacy leakage in large language models
S Kim, S Yun, H Lee, M Gubri, S Yoon, SJ Oh
Advances in Neural Information Processing Systems 36, 20750-20762, 2023
1422023
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Artikkelit 1–20